Nondestructive method and apparatus for imaging grains in curved surfaces of polycrystalline articles
Abstract
A nondestructive method, and associated apparatus, are provided for determining the grain flow of the grains in a convex curved, textured polycrystalline surface. The convex, curved surface of a polycrystalline article is aligned in a horizontal x-ray diffractometer and a monochromatic, converging x-ray beam is directed onto the curved surface of the polycrystalline article so that the converging x-ray beam is diffracted by crystallographic planes of the grains in the polycrystalline article. The diffracted x-ray beam is caused to pass through a set of horizontal, parallel slits to limit the height of the beam and thereafter. The linear intensity of the diffracted x-ray is measured, using a linear position sensitive proportional counter, as a function of position in a direction orthogonal to the counter so as to generate two dimensional data. An image of the grains in the curved surface of the polycrystalline article is provided based on the two-dimensional data.
- Inventors:
-
- Lenior City, TN
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- OSTI Identifier:
- 869897
- Patent Number(s):
- 5418828
- Assignee:
- United States of America as represented by Department of Energy (Washington, DC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AC05-84OR21400
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- nondestructive; method; apparatus; imaging; grains; curved; surfaces; polycrystalline; articles; associated; provided; determining; grain; flow; convex; textured; surface; article; aligned; horizontal; x-ray; diffractometer; monochromatic; converging; beam; directed; diffracted; crystallographic; planes; caused; pass; set; parallel; slits; limit; height; thereafter; linear; intensity; measured; position; sensitive; proportional; counter; function; direction; orthogonal; generate; dimensional; data; image; based; two-dimensional; nondestructive method; curved surface; proportional counter; x-ray beam; position sensitive; curved surfaces; dimensional data; sensitive proportional; provided based; linear intensity; x-ray diffractometer; /378/
Citation Formats
Carpenter, Donald A. Nondestructive method and apparatus for imaging grains in curved surfaces of polycrystalline articles. United States: N. p., 1995.
Web.
Carpenter, Donald A. Nondestructive method and apparatus for imaging grains in curved surfaces of polycrystalline articles. United States.
Carpenter, Donald A. Sun .
"Nondestructive method and apparatus for imaging grains in curved surfaces of polycrystalline articles". United States. https://www.osti.gov/servlets/purl/869897.
@article{osti_869897,
title = {Nondestructive method and apparatus for imaging grains in curved surfaces of polycrystalline articles},
author = {Carpenter, Donald A},
abstractNote = {A nondestructive method, and associated apparatus, are provided for determining the grain flow of the grains in a convex curved, textured polycrystalline surface. The convex, curved surface of a polycrystalline article is aligned in a horizontal x-ray diffractometer and a monochromatic, converging x-ray beam is directed onto the curved surface of the polycrystalline article so that the converging x-ray beam is diffracted by crystallographic planes of the grains in the polycrystalline article. The diffracted x-ray beam is caused to pass through a set of horizontal, parallel slits to limit the height of the beam and thereafter. The linear intensity of the diffracted x-ray is measured, using a linear position sensitive proportional counter, as a function of position in a direction orthogonal to the counter so as to generate two dimensional data. An image of the grains in the curved surface of the polycrystalline article is provided based on the two-dimensional data.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {1}
}
Works referenced in this record:
Polycrystal scattering topography
journal, February 1982
- Chikaura, Y.; Yoneda, Y.; Hildebrandt, G.
- Journal of Applied Crystallography, Vol. 15, Issue 1