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Title: Method and apparatus for holographic wavefront diagnostics

Abstract

A wavefront diagnostic apparatus has an optic and a measuring system. The optic forms a holographic image in response to a beam of light striking a hologram formed on a surface of the optic. The measuring system detects the position of the array of holographic images and compares the positions of the array of holographic images to a reference holographic image.

Inventors:
 [1]
  1. Livermore, CA
Issue Date:
Research Org.:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
OSTI Identifier:
869852
Patent Number(s):
5410397
Assignee:
United States of America as represented by United States (Washington, DC)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
G - PHYSICS G03 - PHOTOGRAPHY G03H - HOLOGRAPHIC PROCESSES OR APPARATUS
DOE Contract Number:  
W-7405-ENG-48
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; holographic; wavefront; diagnostics; diagnostic; optic; measuring; forms; image; response; beam; light; striking; hologram; formed; surface; detects; position; array; images; compares; positions; reference; holographic image; holographic images; diagnostic apparatus; hologram formed; wavefront diagnostic; /356/250/

Citation Formats

Toeppen, John S. Method and apparatus for holographic wavefront diagnostics. United States: N. p., 1995. Web.
Toeppen, John S. Method and apparatus for holographic wavefront diagnostics. United States.
Toeppen, John S. Sun . "Method and apparatus for holographic wavefront diagnostics". United States. https://www.osti.gov/servlets/purl/869852.
@article{osti_869852,
title = {Method and apparatus for holographic wavefront diagnostics},
author = {Toeppen, John S},
abstractNote = {A wavefront diagnostic apparatus has an optic and a measuring system. The optic forms a holographic image in response to a beam of light striking a hologram formed on a surface of the optic. The measuring system detects the position of the array of holographic images and compares the positions of the array of holographic images to a reference holographic image.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {1}
}

Works referenced in this record:

Binary optic interconnects: design, fabrication and limits on implementation
conference, November 1991


Optimum design of phase gratings for diffractive optical elements obtained by thin-film deposition
conference, November 1991


Video Hartmann wavefront diagnostic that incorporates a monolithic microlens array
conference, November 1991


Hartmann-Shack wavefront sensor using a binary optic lenslet array
conference, November 1991


High-speed binary optic microlens array in GaAs
conference, November 1991


Microlens array for staring infrared imager
conference, November 1991


Silicon microlenses for enhanced optical coupling to silicon focal planes
conference, November 1991