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Title: Method for accurate growth of vertical-cavity surface-emitting lasers

Abstract

We report a method for accurate growth of vertical-cavity surface-emitting lasers (VCSELs). The method uses a single reflectivity spectrum measurement to determine the structure of the partially completed VCSEL at a critical point of growth. This information, along with the extracted growth rates, allows imprecisions in growth parameters to be compensated for during growth of the remaining structure, which can then be completed with very accurate critical dimensions. Using this method, we can now routinely grow lasing VCSELs with Fabry-Perot cavity resonance wavelengths controlled to within 0.5%.

Inventors:
 [1];  [1];  [1]
  1. Albuquerque, NM
Issue Date:
Research Org.:
AT&T
OSTI Identifier:
869790
Patent Number(s):
5397739
Assignee:
Sandia Corporation (Albuquerque, NM)
Patent Classifications (CPCs):
B - PERFORMING OPERATIONS B24 - GRINDING B24B - MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
DOE Contract Number:  
AC04-76DP00789
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; accurate; growth; vertical-cavity; surface-emitting; lasers; report; vcsels; single; reflectivity; spectrum; measurement; determine; structure; partially; completed; vcsel; critical; information; extracted; rates; allows; imprecisions; parameters; compensated; remaining; dimensions; routinely; grow; lasing; fabry-perot; cavity; resonance; wavelengths; controlled; cavity surface; surface-emitting laser; growth rate; vertical-cavity surface-emitting; partially completed; surface-emitting lasers; critical dimension; growth rates; emitting laser; fabry-perot cavity; cavity resonance; resonance wavelengths; resonance wavelength; emitting lasers; accurate growth; critical dimensions; /438/117/

Citation Formats

Chalmers, Scott A, Killeen, Kevin P, and Lear, Kevin L. Method for accurate growth of vertical-cavity surface-emitting lasers. United States: N. p., 1995. Web.
Chalmers, Scott A, Killeen, Kevin P, & Lear, Kevin L. Method for accurate growth of vertical-cavity surface-emitting lasers. United States.
Chalmers, Scott A, Killeen, Kevin P, and Lear, Kevin L. Sun . "Method for accurate growth of vertical-cavity surface-emitting lasers". United States. https://www.osti.gov/servlets/purl/869790.
@article{osti_869790,
title = {Method for accurate growth of vertical-cavity surface-emitting lasers},
author = {Chalmers, Scott A and Killeen, Kevin P and Lear, Kevin L},
abstractNote = {We report a method for accurate growth of vertical-cavity surface-emitting lasers (VCSELs). The method uses a single reflectivity spectrum measurement to determine the structure of the partially completed VCSEL at a critical point of growth. This information, along with the extracted growth rates, allows imprecisions in growth parameters to be compensated for during growth of the remaining structure, which can then be completed with very accurate critical dimensions. Using this method, we can now routinely grow lasing VCSELs with Fabry-Perot cavity resonance wavelengths controlled to within 0.5%.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 1995},
month = {Sun Jan 01 00:00:00 EST 1995}
}

Works referenced in this record:

Real‐time optical diagnostics for epitaxial growth
journal, May 1991

  • Aspnes, D. E.; Quinn, W. E.; Gregory, S.
  • Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 9, Issue 3
  • https://doi.org/10.1116/1.577332

Molecular beam epitaxy growth of vertical cavity optical devices with in situ corrections
journal, September 1992


Diffuse optical reflectivity measurements on GaAs during molecular‐beam epitaxy processing
journal, July 1992

  • Lavoie, C.; Johnson, S. R.; Mackenzie, J. A.
  • Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 10, Issue 4
  • https://doi.org/10.1116/1.577880

Method for accurate growth of vertical‐cavity surface‐emitting lasers
journal, March 1993