Scanning micro-sclerometer

Title: Scanning micro-sclerometer

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Abstract

A scanning micro-sclerometer measures changes in contact stiffness and correlates these changes to characteristics of a scratch. A known force is applied to a contact junction between two bodies and a technique employing an oscillating force is used to generate the contact stiffness between the two bodies. As the two bodies slide relative to each other, the contact stiffness changes. The change is measured to characterize the scratch.

Inventors:

Oliver, Warren C ^[1]; Blau, Peter J ^[2]

Knoxville, TN
Oak Ridge, TN

Issue Date:: 1994-01-01

Research Org.:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

OSTI Identifier:: 869584

Patent Number(s):: 5359879

Assignee:: Martin Marietta Energy Systems, Inc. (Oak Ridge, TN)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

G - PHYSICS G01 - MEASURING G01H - MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES

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G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2203/005 - Electromagnetic means
G01N2203/0078 - using indentation
G01N2291/02827 - Elastic parameters, strength or force
G01N2203/0005 - Repeated or cyclic
G01N3/46 - the indentors performing a scratching movement
G01N3/405 - {by determining the vibration frequency of a sensing element in contact with the specimen}
G01N2203/0286 - Miniature specimen

G - PHYSICS G01 - MEASURING G01H - MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
G01H13/00 - Measuring resonant frequency

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DOE Contract Number:: AC05-84OR21400

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: scanning; micro-sclerometer; measures; changes; contact; stiffness; correlates; characteristics; scratch; force; applied; junction; bodies; technique; employing; oscillating; generate; slide; relative; change; measured; characterize; scanning micro-sclerometer; meter measures; /73/

Citation Formats


                    Oliver, Warren C, and Blau, Peter J. Scanning micro-sclerometer.  United States: N. p., 1994. 
        Web.

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                    Oliver, Warren C, & Blau, Peter J. Scanning micro-sclerometer.  United States.

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                    Oliver, Warren C, and Blau, Peter J. Sat .  
        "Scanning micro-sclerometer".  United States.  https://www.osti.gov/servlets/purl/869584.

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@article{osti_869584,

  title        = {Scanning micro-sclerometer},

  author       = {Oliver, Warren C and Blau, Peter J},

  abstractNote = {A scanning micro-sclerometer measures changes in contact stiffness and correlates these changes to characteristics of a scratch. A known force is applied to a contact junction between two bodies and a technique employing an oscillating force is used to generate the contact stiffness between the two bodies. As the two bodies slide relative to each other, the contact stiffness changes. The change is measured to characterize the scratch.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1994},

  month        = {1}

}

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