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Title: Apparatus and method for spectroscopic analysis of scattering media

Apparatus and method for spectroscopic analysis of scattering media. Subtle differences in materials have been found to be detectable from plots of intensity as a function of wavelength of collected emitted and scattered light versus wavelength of excitation light.
Inventors:
 [1];  [2];  [3]
  1. (Los Angeles, CA)
  2. (Los Alamos, NM)
  3. (Santa Fe, NM)
Issue Date:
OSTI Identifier:
869237
Assignee:
Regents of University of California (CA); Los Alamos National (Los Alamos, NM) LANL
Patent Number(s):
US 5303026
Contract Number:
W-7405-ENG-36
Research Org:
Los Alamos National Laboratory (LANL), Los Alamos, NM
Country of Publication:
United States
Language:
English
Subject:
apparatus; method; spectroscopic; analysis; scattering; media; subtle; differences; materials; found; detectable; plots; intensity; function; wavelength; collected; emitted; scattered; light; versus; excitation; spectroscopic analysis; scattered light; excitation light; scattering media; versus wavelength; /356/250/600/