Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner

Title: Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner

Abstract

An ultra short (<10 ps), high power laser pulse is temporally characterized by a system that uses a physical measurement of a wavefront that has been altered in a known manner. The system includes a first reflection switch to remove a portion of a pulse from a beam of pulses, then includes a second reflection switch, operating in a mode that is opposite to the first reflection switch, to slice off a portion of that removed portion. The sliced portion is then directed to a measuring device for physical measurement. The two reflection switches are arranged with respect to each other and with respect to the beam of ultra short pulses such that physical measurement of the sliced portion is related to the temporal measurement of the ultra short pulse by a geometric or trigonometric relationship. The reflection switches are operated by a control pulse that is directed to impinge on each of the reflection switches at a 90.degree. angle of incidence.

Inventors:

Veligdan, James T ^[1]

Manorville, NY

Issue Date:: 1994-01-01

Research Org.:: Associated Universities, Inc., Upton, NY (United States)

OSTI Identifier:: 869184

Patent Number(s):: 5293397

Assignee:: Associated Universities, Inc. (Washington, DC)

Patent Classifications (CPCs):: G - PHYSICS G04 - HOROLOGY G04F - TIME-INTERVAL MEASURING

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G - PHYSICS G04 - HOROLOGY G04F - TIME-INTERVAL MEASURING
G04F13/026 - {Measuring duration of ultra-short light pulses, e.g. in the pico-second range

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DOE Contract Number:: AC02-76CH00016

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: means; method; characterizing; power; ultra; laser; pulses; time; line; manner; 10; pulse; temporally; characterized; physical; measurement; wavefront; altered; reflection; switch; remove; portion; beam; operating; mode; opposite; slice; removed; sliced; directed; measuring; device; switches; arranged; respect; related; temporal; geometric; trigonometric; relationship; operated; control; impinge; 90; degree; angle; incidence; laser pulses; laser pulse; measuring device; power laser; /372/359/

Citation Formats


                    Veligdan, James T. Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner.  United States: N. p., 1994. 
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                    Veligdan, James T. Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner.  United States.

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                    Veligdan, James T. Sat .  
        "Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner".  United States.  https://www.osti.gov/servlets/purl/869184.

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@article{osti_869184,

  title        = {Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner},

  author       = {Veligdan, James T},

  abstractNote = {An ultra short (<10 ps), high power laser pulse is temporally characterized by a system that uses a physical measurement of a wavefront that has been altered in a known manner. The system includes a first reflection switch to remove a portion of a pulse from a beam of pulses, then includes a second reflection switch, operating in a mode that is opposite to the first reflection switch, to slice off a portion of that removed portion. The sliced portion is then directed to a measuring device for physical measurement. The two reflection switches are arranged with respect to each other and with respect to the beam of ultra short pulses such that physical measurement of the sliced portion is related to the temporal measurement of the ultra short pulse by a geometric or trigonometric relationship. The reflection switches are operated by a control pulse that is directed to impinge on each of the reflection switches at a 90.degree. angle of incidence.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1994},

  month        = {1}

}

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Works referenced in this record:

Single-shot measurement of a 52-fs pulse
journal, January 1987

Salin, F.; Georges, P.; Roger, G.
Applied Optics, Vol. 26, Issue 21
https://doi.org/10.1364/AO.26.004528

Versatile single-shot background-free pulse duration measurement technique, for pulses of subnanosecond to picosecond duration
journal, July 1981

Wyatt, R.; Marinero, E. E.
Applied Physics, Vol. 25, Issue 3
https://doi.org/10.1007/BF00902986

Spatial dynamics of picosecond CO 2 laser pulses produced by optical switching in Ge
conference, June 1991

Pogorelsky, Igor V.; Fisher, Alan S.; Veligdan, James T.
Optics, Electro-Optics, and Laser Applications in Science and Engineering, SPIE Proceedings
https://doi.org/10.1117/12.46132

Amplification of picosecond 10 µm pulses in multiatmosphere CO ₂ lasers
journal, March 1985

Corkum, P.
IEEE Journal of Quantum Electronics, Vol. 21, Issue 3
https://doi.org/10.1109/JQE.1985.1072638

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Title: Means and method for characterizing high power, ultra short laser pulses in a real time, on line manner

Abstract

Citation Formats

Single-shot measurement of a 52-fs pulse journal, January 1987

Versatile single-shot background-free pulse duration measurement technique, for pulses of subnanosecond to picosecond duration journal, July 1981

Spatial dynamics of picosecond CO 2 laser pulses produced by optical switching in Ge conference, June 1991

Amplification of picosecond 10 µm pulses in multiatmosphere CO 2 lasers journal, March 1985

Single-shot measurement of a 52-fs pulse
journal, January 1987

Versatile single-shot background-free pulse duration measurement technique, for pulses of subnanosecond to picosecond duration
journal, July 1981

Spatial dynamics of picosecond CO 2 laser pulses produced by optical switching in Ge
conference, June 1991

Amplification of picosecond 10 µm pulses in multiatmosphere CO ₂ lasers
journal, March 1985