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Title: Apparatus and method for measuring and imaging surface resistance

Abstract

Apparatus and method for determining and imaging superconductor surface resistance. The apparatus comprises modified Gaussian confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor.

Inventors:
 [1];  [2];  [3]
  1. Albuquerque, NM
  2. Placitas, NM
  3. Madison, WI
Issue Date:
OSTI Identifier:
868897
Patent Number(s):
5239269
Application Number:
07/789,225
Assignee:
United States of America as represented by United States (Washington, DC)
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
apparatus; method; measuring; imaging; surface; resistance; determining; superconductor; comprises; modified; gaussian; confocal; resonator; structure; sample; remote; radiating; mirror; determined; analyzing; reflected; microwaves; reveals; anomalies; due; impurities; non-stoichiometry; surface resistance; apparatus comprises; apparatus comprise; resonator structure; surface impurities; imaging surface; sample remote; reflected microwave; confocal resonator; /324/

Citation Formats

Martens, Jon S, Hietala, Vincent M, and Hohenwarter, Gert K. G. Apparatus and method for measuring and imaging surface resistance. United States: N. p., 1993. Web.
Martens, Jon S, Hietala, Vincent M, & Hohenwarter, Gert K. G. Apparatus and method for measuring and imaging surface resistance. United States.
Martens, Jon S, Hietala, Vincent M, and Hohenwarter, Gert K. G. Tue . "Apparatus and method for measuring and imaging surface resistance". United States. https://www.osti.gov/servlets/purl/868897.
@article{osti_868897,
title = {Apparatus and method for measuring and imaging surface resistance},
author = {Martens, Jon S and Hietala, Vincent M and Hohenwarter, Gert K. G.},
abstractNote = {Apparatus and method for determining and imaging superconductor surface resistance. The apparatus comprises modified Gaussian confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1993},
month = {8}
}

Patent:

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