Apparatus and method for measuring and imaging surface resistance

Martens, Jon S; Hietala, Vincent M; Hohenwarter, Gert K. G.

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Title: Apparatus and method for measuring and imaging surface resistance

Abstract

Apparatus and method for determining and imaging superconductor surface resistance. The apparatus comprises modified Gaussian confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor.

Inventors:

Martens, Jon S ^[1]; Hietala, Vincent M ^[2]; Hohenwarter, Gert K. G. ^[3]

Albuquerque, NM
Placitas, NM
Madison, WI

Issue Date:: 1993-01-01

OSTI Identifier:: 868897

Patent Number(s):: 5239269

Application Number:: 07/789,225

Assignee:: United States of America as represented by United States (Washington, DC)

Patent Classifications (CPCs):: G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES

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G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
G01R27/06 - Measuring reflection coefficients

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Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: apparatus; method; measuring; imaging; surface; resistance; determining; superconductor; comprises; modified; gaussian; confocal; resonator; structure; sample; remote; radiating; mirror; determined; analyzing; reflected; microwaves; reveals; anomalies; due; impurities; non-stoichiometry; surface resistance; apparatus comprises; apparatus comprise; resonator structure; surface impurities; imaging surface; sample remote; reflected microwave; confocal resonator; /324/

Citation Formats


                    Martens, Jon S, Hietala, Vincent M, and Hohenwarter, Gert K. G. Apparatus and method for measuring and imaging surface resistance.  United States: N. p., 1993. 
        Web.

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                    Martens, Jon S, Hietala, Vincent M, & Hohenwarter, Gert K. G. Apparatus and method for measuring and imaging surface resistance.  United States.

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                    Martens, Jon S, Hietala, Vincent M, and Hohenwarter, Gert K. G. Fri .  
        "Apparatus and method for measuring and imaging surface resistance".  United States.  https://www.osti.gov/servlets/purl/868897.

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@article{osti_868897,

  title        = {Apparatus and method for measuring and imaging surface resistance},

  author       = {Martens, Jon S and Hietala, Vincent M and Hohenwarter, Gert K. G.},

  abstractNote = {Apparatus and method for determining and imaging superconductor surface resistance. The apparatus comprises modified Gaussian confocal resonator structure with the sample remote from the radiating mirror. Surface resistance is determined by analyzing and imaging reflected microwaves; imaging reveals anomalies due to surface impurities, non-stoichiometry, and the like, in the surface of the superconductor.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1993},

  month        = {1}

}

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Works referenced in this record:

Morphology control and high critical currents in superconducting thin films in the Tl-Ca-Ba-Cu-O system
journal, August 1989

Ginley, D. S.; Kwak, J. F.; Venturini, E. L.
Physica C: Superconductivity, Vol. 160, Issue 1
https://doi.org/10.1016/0921-4534(89)90450-4

The effects of processing sequences on the microwave surface resistance of TlCaBaCuO
journal, June 1991

Martens, J. S.; Zipperian, T. E.; Ginley, D. S.
Journal of Applied Physics, Vol. 69, Issue 12
https://doi.org/10.1063/1.347434

Infrared and Optical Masers
journal, December 1958

Schawlow, A. L.; Townes, C. H.
Physical Review, Vol. 112, Issue 6
https://doi.org/10.1103/PhysRev.112.1940

Confocal resonators for measuring the surface resistance of high‐temperature superconducting films
journal, June 1991

Martens, J. S.; Hietala, V. M.; Ginley, D. S.
Applied Physics Letters, Vol. 58, Issue 22
https://doi.org/10.1063/1.104821

Microwave surface resistance of YBa ₂ Cu ₃ O _6.9 superconducting films
journal, May 1988

Martens, J. S.; Beyer, J. B.; Ginley, D. S.
Applied Physics Letters, Vol. 52, Issue 21
https://doi.org/10.1063/1.99726

The role of low temperatures in the operation of logic circuitry
journal, January 1970

Keyes, R. W.; Harris, E. P.; Konnerth, K. L.
Proceedings of the IEEE, Vol. 58, Issue 12
https://doi.org/10.1109/PROC.1970.8063

On the Focused Fabry-Perot Resonator in Plasma Diagnostics (Correspondence)
journal, September 1964

Lonngren, K. E.; Mink, J. W.; Beyer, J. B.
IEEE Transactions on Microwave Theory and Techniques, Vol. 12, Issue 5
https://doi.org/10.1109/TMTT.1964.1125873

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Title: Apparatus and method for measuring and imaging surface resistance

Abstract

Citation Formats

Morphology control and high critical currents in superconducting thin films in the Tl-Ca-Ba-Cu-O system journal, August 1989

The effects of processing sequences on the microwave surface resistance of TlCaBaCuO journal, June 1991

Infrared and Optical Masers journal, December 1958

Confocal resonators for measuring the surface resistance of high‐temperature superconducting films journal, June 1991

Microwave surface resistance of YBa 2 Cu 3 O 6.9 superconducting films journal, May 1988

The role of low temperatures in the operation of logic circuitry journal, January 1970

On the Focused Fabry-Perot Resonator in Plasma Diagnostics (Correspondence) journal, September 1964

Morphology control and high critical currents in superconducting thin films in the Tl-Ca-Ba-Cu-O system
journal, August 1989

The effects of processing sequences on the microwave surface resistance of TlCaBaCuO
journal, June 1991

Infrared and Optical Masers
journal, December 1958

Confocal resonators for measuring the surface resistance of high‐temperature superconducting films
journal, June 1991

Microwave surface resistance of YBa ₂ Cu ₃ O _6.9 superconducting films
journal, May 1988

The role of low temperatures in the operation of logic circuitry
journal, January 1970

On the Focused Fabry-Perot Resonator in Plasma Diagnostics (Correspondence)
journal, September 1964