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Title: Method and apparatus for atomic imaging

Abstract

A method and apparatus for three dimensional imaging of the atomic environment of disordered adsorbate atoms are disclosed. The method includes detecting and measuring the intensity of a diffuse low energy electron diffraction pattern formed by directing a beam of low energy electrons against the surface of a crystal. Data corresponding to reconstructed amplitudes of a wave form is generated by operating on the intensity data. The data corresponding to the reconstructed amplitudes is capable of being displayed as a three dimensional image of an adsorbate atom. The apparatus includes a source of a beam of low energy electrons and a detector for detecting the intensity distribution of a DLEED pattern formed at the detector when the beam of low energy electrons is directed onto the surface of a crystal. A device responsive to the intensity distribution generates a signal corresponding to the distribution which represents a reconstructed amplitude of a wave form and is capable of being converted into a three dimensional image of the atomic environment of an adsorbate atom on the crystal surface.

Inventors:
 [1];  [2]
  1. (Milwaukee, WI)
  2. (Madrid, ES)
Issue Date:
Research Org.:
Sandia National Laboratories (SNL), Albuquerque, NM, and Livermore, CA
OSTI Identifier:
868732
Patent Number(s):
5200618
Assignee:
University of Wisconsin - Milwaukee (Milwaukee, WI) SNL
DOE Contract Number:  
AC04-76
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; atomic; imaging; dimensional; environment; disordered; adsorbate; atoms; disclosed; detecting; measuring; intensity; diffuse; energy; electron; diffraction; pattern; formed; directing; beam; electrons; surface; crystal; data; corresponding; reconstructed; amplitudes; wave; form; generated; operating; capable; displayed; image; atom; source; detector; distribution; dleed; directed; device; responsive; generates; signal; represents; amplitude; converted; signal corresponding; wave form; energy electrons; energy electron; data corresponding; diffraction pattern; intensity distribution; pattern formed; dimensional imaging; crystal surface; dimensional image; /250/359/

Citation Formats

Saldin, Dilano K., and de Andres Rodriquez, Pedro L. Method and apparatus for atomic imaging. United States: N. p., 1993. Web.
Saldin, Dilano K., & de Andres Rodriquez, Pedro L. Method and apparatus for atomic imaging. United States.
Saldin, Dilano K., and de Andres Rodriquez, Pedro L. Fri . "Method and apparatus for atomic imaging". United States. https://www.osti.gov/servlets/purl/868732.
@article{osti_868732,
title = {Method and apparatus for atomic imaging},
author = {Saldin, Dilano K. and de Andres Rodriquez, Pedro L.},
abstractNote = {A method and apparatus for three dimensional imaging of the atomic environment of disordered adsorbate atoms are disclosed. The method includes detecting and measuring the intensity of a diffuse low energy electron diffraction pattern formed by directing a beam of low energy electrons against the surface of a crystal. Data corresponding to reconstructed amplitudes of a wave form is generated by operating on the intensity data. The data corresponding to the reconstructed amplitudes is capable of being displayed as a three dimensional image of an adsorbate atom. The apparatus includes a source of a beam of low energy electrons and a detector for detecting the intensity distribution of a DLEED pattern formed at the detector when the beam of low energy electrons is directed onto the surface of a crystal. A device responsive to the intensity distribution generates a signal corresponding to the distribution which represents a reconstructed amplitude of a wave form and is capable of being converted into a three dimensional image of the atomic environment of an adsorbate atom on the crystal surface.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1993},
month = {1}
}

Patent:

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