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Title: Quantitative method for measuring heat flux emitted from a cryogenic object

Abstract

The present invention is a quantitative method for measuring the total heat flux, and of deriving the total power dissipation, of a heat-fluxing object which includes the steps of placing an electrical noise-emitting heat-fluxing object in a liquid helium bath and measuring the superfluid transition temperature of the bath. The temperature of the liquid helium bath is thereafter reduced until some measurable parameter, such as the electrical noise, exhibited by the heat-fluxing object or a temperature-dependent resistive thin film in intimate contact with the heat-fluxing object, becomes greatly reduced. The temperature of the liquid helum bath is measured at this point. The difference between the superfluid transition temperature of the liquid helium bath surrounding the heat-fluxing object, and the temperature of the liquid helium bath when the electrical noise emitted by the heat-fluxing object becomes greatly reduced, is determined. The total heat flux from the heat-fluxing object is determined as a function of this difference between these temperatures. In certain applications, the technique can be used to optimize thermal design parameters of cryogenic electronics, for example, Josephson junction and infra-red sensing devices.

Inventors:
 [1]
  1. Tijeras, NM
Issue Date:
Research Org.:
AT & T CORP
OSTI Identifier:
868695
Patent Number(s):
5193909
Assignee:
United States of America as represented by United States (Washington, DC)
DOE Contract Number:  
AC04-76DP00789
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
quantitative; method; measuring; heat; flux; emitted; cryogenic; total; deriving; power; dissipation; heat-fluxing; steps; placing; electrical; noise-emitting; liquid; helium; bath; superfluid; transition; temperature; thereafter; reduced; measurable; parameter; noise; exhibited; temperature-dependent; resistive; film; intimate; contact; greatly; helum; measured; difference; surrounding; determined; function; temperatures; applications; technique; optimize; thermal; design; parameters; electronics; example; josephson; junction; infra-red; sensing; devices; power dissipation; josephson junction; measuring heat; heat flux; intimate contact; sensing device; transition temperature; greatly reduced; liquid helium; quantitative method; sensing devices; total heat; electrical noise; total power; greatly reduce; design parameters; /374/

Citation Formats

Duncan, Robert V. Quantitative method for measuring heat flux emitted from a cryogenic object. United States: N. p., 1993. Web.
Duncan, Robert V. Quantitative method for measuring heat flux emitted from a cryogenic object. United States.
Duncan, Robert V. Fri . "Quantitative method for measuring heat flux emitted from a cryogenic object". United States. https://www.osti.gov/servlets/purl/868695.
@article{osti_868695,
title = {Quantitative method for measuring heat flux emitted from a cryogenic object},
author = {Duncan, Robert V},
abstractNote = {The present invention is a quantitative method for measuring the total heat flux, and of deriving the total power dissipation, of a heat-fluxing object which includes the steps of placing an electrical noise-emitting heat-fluxing object in a liquid helium bath and measuring the superfluid transition temperature of the bath. The temperature of the liquid helium bath is thereafter reduced until some measurable parameter, such as the electrical noise, exhibited by the heat-fluxing object or a temperature-dependent resistive thin film in intimate contact with the heat-fluxing object, becomes greatly reduced. The temperature of the liquid helum bath is measured at this point. The difference between the superfluid transition temperature of the liquid helium bath surrounding the heat-fluxing object, and the temperature of the liquid helium bath when the electrical noise emitted by the heat-fluxing object becomes greatly reduced, is determined. The total heat flux from the heat-fluxing object is determined as a function of this difference between these temperatures. In certain applications, the technique can be used to optimize thermal design parameters of cryogenic electronics, for example, Josephson junction and infra-red sensing devices.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1993},
month = {1}
}

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