Apparatus and method for transient thermal infrared emission spectrometry
Abstract
A method and apparatus for enabling analysis of a solid material (16, 42) by applying energy from an energy source (20, 70) top a surface region of the solid material sufficient to cause transient heating in a thin surface layer portion of the solid material (16, 42) so as to enable transient thermal emission of infrared radiation from the thin surface layer portion, and by detecting with a spectrometer/detector (28, 58) substantially only the transient thermal emission of infrared radiation from the thin surface layer portion of the solid material. The detected transient thermal emission of infrared radiation is sufficiently free of self-absorption by the solid material of emitted infrared radiation, so as to be indicative of characteristics relating to molecular composition of the solid material.
- Inventors:
-
- Ames, IA
- Issue Date:
- Research Org.:
- Ames Laboratory (AMES), Ames, IA; Iowa State Univ., Ames, IA (United States)
- OSTI Identifier:
- 868102
- Patent Number(s):
- 5075552
- Application Number:
- 07/576,448
- Assignee:
- Iowa State University Research Foundation Inc. (Ames, IA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- W-7405-ENG-82
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- apparatus; method; transient; thermal; infrared; emission; spectrometry; enabling; analysis; solid; material; 16; 42; applying; energy; source; 20; 70; top; surface; region; sufficient; heating; layer; portion; enable; radiation; detecting; spectrometer; detector; 28; 58; substantially; detected; sufficiently; free; self-absorption; emitted; indicative; characteristics; relating; molecular; composition; transient thermal; layer portion; sufficiently free; thermal infrared; surface region; infrared emission; energy source; infrared radiation; solid material; surface layer; molecular composition; characteristics relating; emitted infrared; material sufficient; enabling analysis; applying energy; /250/
Citation Formats
McClelland, John F, and Jones, Roger W. Apparatus and method for transient thermal infrared emission spectrometry. United States: N. p., 1991.
Web.
McClelland, John F, & Jones, Roger W. Apparatus and method for transient thermal infrared emission spectrometry. United States.
McClelland, John F, and Jones, Roger W. Tue .
"Apparatus and method for transient thermal infrared emission spectrometry". United States. https://www.osti.gov/servlets/purl/868102.
@article{osti_868102,
title = {Apparatus and method for transient thermal infrared emission spectrometry},
author = {McClelland, John F and Jones, Roger W},
abstractNote = {A method and apparatus for enabling analysis of a solid material (16, 42) by applying energy from an energy source (20, 70) top a surface region of the solid material sufficient to cause transient heating in a thin surface layer portion of the solid material (16, 42) so as to enable transient thermal emission of infrared radiation from the thin surface layer portion, and by detecting with a spectrometer/detector (28, 58) substantially only the transient thermal emission of infrared radiation from the thin surface layer portion of the solid material. The detected transient thermal emission of infrared radiation is sufficiently free of self-absorption by the solid material of emitted infrared radiation, so as to be indicative of characteristics relating to molecular composition of the solid material.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1991},
month = {12}
}