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Title: Apparatus and method for transient thermal infrared spectrometry

Abstract

A method and apparatus for enabling analysis of a material (16, 42) by applying a cooling medium (20, 54) to cool a thin surface layer portion of the material and to transiently generate a temperature differential between the thin surface layer portion and the lower portion of the material sufficient to alter the thermal infrared emission spectrum of the material from the black-body thermal infrared emission spectrum of the material. The altered thermal infrared emission spectrum of the material is detected by a spectrometer/detector (28, 50) while the altered thermal infrared emission spectrum is sufficiently free of self-absorption by the material of the emitted infrared radiation. The detection is effected prior to the temperature differential propagating into the lower portion of the material to an extent such that the altered thermal infrared emission spectrum is no longer sufficiently free of self-absorption by the material of emitted infrared radiation, so that the detected altered thermal infrared emission spectrum is indicative of the characteristics relating to the molecular composition of the material.

Inventors:
 [1];  [1]
  1. Ames, IA
Issue Date:
Research Org.:
Ames Lab., Ames, IA (United States); Iowa State Univ., Ames, IA (United States)
OSTI Identifier:
868083
Patent Number(s):
5070242
Application Number:
07/546,738
Assignee:
Iowa State University Research Foundation, Inc. (Ames, IA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
W-7405-ENG-82
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
apparatus; method; transient; thermal; infrared; spectrometry; enabling; analysis; material; 16; 42; applying; cooling; medium; 20; 54; cool; surface; layer; portion; transiently; generate; temperature; differential; sufficient; alter; emission; spectrum; black-body; altered; detected; spectrometer; detector; 28; 50; sufficiently; free; self-absorption; emitted; radiation; detection; effected; prior; propagating; extent; indicative; characteristics; relating; molecular; composition; transient thermal; layer portion; sufficiently free; thermal infrared; cooling medium; emission spectrum; infrared emission; infrared radiation; surface layer; temperature differential; molecular composition; characteristics relating; emitted infrared; material sufficient; enabling analysis; infrared spectrometry; transiently generate; /250/

Citation Formats

McClelland, John F, and Jones, Roger W. Apparatus and method for transient thermal infrared spectrometry. United States: N. p., 1991. Web.
McClelland, John F, & Jones, Roger W. Apparatus and method for transient thermal infrared spectrometry. United States.
McClelland, John F, and Jones, Roger W. Tue . "Apparatus and method for transient thermal infrared spectrometry". United States. https://www.osti.gov/servlets/purl/868083.
@article{osti_868083,
title = {Apparatus and method for transient thermal infrared spectrometry},
author = {McClelland, John F and Jones, Roger W},
abstractNote = {A method and apparatus for enabling analysis of a material (16, 42) by applying a cooling medium (20, 54) to cool a thin surface layer portion of the material and to transiently generate a temperature differential between the thin surface layer portion and the lower portion of the material sufficient to alter the thermal infrared emission spectrum of the material from the black-body thermal infrared emission spectrum of the material. The altered thermal infrared emission spectrum of the material is detected by a spectrometer/detector (28, 50) while the altered thermal infrared emission spectrum is sufficiently free of self-absorption by the material of the emitted infrared radiation. The detection is effected prior to the temperature differential propagating into the lower portion of the material to an extent such that the altered thermal infrared emission spectrum is no longer sufficiently free of self-absorption by the material of emitted infrared radiation, so that the detected altered thermal infrared emission spectrum is indicative of the characteristics relating to the molecular composition of the material.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1991},
month = {12}
}

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