Diffraction encoded position measuring apparatus
Abstract
When a lightwave passes through a transmission grating, diffracted beams appear at the output or opposite side of the grating that are effectively Doppler shifted in frequency (phase) whereby a detector system can compare the phase of the zero order and higher order beams to obtain an indication of position. Multiple passes through the grating increase resolution for a given wavelength of a laser signal. The resolution can be improved further by using a smaller wavelength laser to generate the grating itself. Since the grating must only have a pitch sufficient to produce diffracted orders, inexpensive, ultraviolet wavelength lasers can be utilized and still obtain high resolution detection.
- Inventors:
-
- Thousand Oaks, CA
- Issue Date:
- Research Org.:
- Rockwell International Corp., Canoga Park, CA (United States)
- OSTI Identifier:
- 867996
- Patent Number(s):
- 5050993
- Assignee:
- Rockwell International Corporation (El Segundo, CA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01D - MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
- DOE Contract Number:
- AC03-86SF16499
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- diffraction; encoded; position; measuring; apparatus; lightwave; passes; transmission; grating; diffracted; beams; appear; output; opposite; effectively; doppler; shifted; frequency; phase; whereby; detector; compare; zero; obtain; indication; multiple; increase; resolution; wavelength; laser; signal; improved; generate; pitch; sufficient; produce; inexpensive; ultraviolet; lasers; utilized; detection; wavelength laser; multiple passes; ultraviolet wavelength; multiple pass; measuring apparatus; doppler shift; diffracted beam; transmission grating; wavelength lasers; diffracted beams; laser signal; /356/250/
Citation Formats
Tansey, Richard J. Diffraction encoded position measuring apparatus. United States: N. p., 1991.
Web.
Tansey, Richard J. Diffraction encoded position measuring apparatus. United States.
Tansey, Richard J. Tue .
"Diffraction encoded position measuring apparatus". United States. https://www.osti.gov/servlets/purl/867996.
@article{osti_867996,
title = {Diffraction encoded position measuring apparatus},
author = {Tansey, Richard J},
abstractNote = {When a lightwave passes through a transmission grating, diffracted beams appear at the output or opposite side of the grating that are effectively Doppler shifted in frequency (phase) whereby a detector system can compare the phase of the zero order and higher order beams to obtain an indication of position. Multiple passes through the grating increase resolution for a given wavelength of a laser signal. The resolution can be improved further by using a smaller wavelength laser to generate the grating itself. Since the grating must only have a pitch sufficient to produce diffracted orders, inexpensive, ultraviolet wavelength lasers can be utilized and still obtain high resolution detection.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1991},
month = {1}
}
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