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Title: Apparatus for characterizing conductivity of materials by measuring the effect of induced shielding currents therein

Abstract

Apparatus and method for noncontact, radio-frequency shielding current characterization of materials. Self- or mutual inductance changes in one or more inductive elements, respectively, occur when materials capable of supporting shielding currents are placed in proximity thereto, or undergo change in resistivity while in place. Such changes can be observed by incorporating the inductor(s) in a resonant circuit and determining the frequency of oscillation or by measuring the voltage induced on a coupled inductive element. The present invention is useful for determining the critical temperature and superconducting transition width for superconducting samples.

Inventors:
 [1]
  1. Los Alamos, NM
Issue Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
OSTI Identifier:
867819
Patent Number(s):
5015952
Assignee:
University of California (Alameda, CA)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
DOE Contract Number:  
W-7405-ENG-36
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
apparatus; characterizing; conductivity; materials; measuring; effect; induced; shielding; currents; therein; method; noncontact; radio-frequency; current; characterization; self-; mutual; inductance; changes; inductive; elements; respectively; occur; capable; supporting; placed; proximity; thereto; undergo; change; resistivity; observed; incorporating; inductor; resonant; circuit; determining; frequency; oscillation; voltage; coupled; element; useful; critical; temperature; superconducting; transition; width; samples; materials capable; resonant circuit; critical temperature; inductive element; shielding currents; voltage induced; mutual inductance; superconducting transition; radio-frequency shielding; shielding current; characterizing conductivity; coupled inductive; inductive elements; inductance changes; superconducting sample; currents therein; current characterization; /324/505/

Citation Formats

Doss, James D. Apparatus for characterizing conductivity of materials by measuring the effect of induced shielding currents therein. United States: N. p., 1991. Web.
Doss, James D. Apparatus for characterizing conductivity of materials by measuring the effect of induced shielding currents therein. United States.
Doss, James D. Tue . "Apparatus for characterizing conductivity of materials by measuring the effect of induced shielding currents therein". United States. https://www.osti.gov/servlets/purl/867819.
@article{osti_867819,
title = {Apparatus for characterizing conductivity of materials by measuring the effect of induced shielding currents therein},
author = {Doss, James D},
abstractNote = {Apparatus and method for noncontact, radio-frequency shielding current characterization of materials. Self- or mutual inductance changes in one or more inductive elements, respectively, occur when materials capable of supporting shielding currents are placed in proximity thereto, or undergo change in resistivity while in place. Such changes can be observed by incorporating the inductor(s) in a resonant circuit and determining the frequency of oscillation or by measuring the voltage induced on a coupled inductive element. The present invention is useful for determining the critical temperature and superconducting transition width for superconducting samples.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1991},
month = {1}
}

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