DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Lens system for a photo ion spectrometer

Abstract

A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system.

Inventors:
 [1];  [2];  [3]
  1. Downers Grove, IL
  2. Westmont, IL
  3. Napersville, IL
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
OSTI Identifier:
867618
Patent Number(s):
4973842
Assignee:
Arch Development Corp. (Chicago, IL)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
W-31109-ENG-38
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
lens; photo; spectrometer; manipulating; primary; beam; ionized; atomic; component; components; removed; sample; extracted; analysis; ionization; resistant; coatings; protecting; resistant coating; atomic components; resistant coatings; atomic component; ionized atomic; /250/

Citation Formats

Gruen, Dieter M, Young, Charles E, and Pellin, Michael J. Lens system for a photo ion spectrometer. United States: N. p., 1990. Web.
Gruen, Dieter M, Young, Charles E, & Pellin, Michael J. Lens system for a photo ion spectrometer. United States.
Gruen, Dieter M, Young, Charles E, and Pellin, Michael J. Mon . "Lens system for a photo ion spectrometer". United States. https://www.osti.gov/servlets/purl/867618.
@article{osti_867618,
title = {Lens system for a photo ion spectrometer},
author = {Gruen, Dieter M and Young, Charles E and Pellin, Michael J},
abstractNote = {A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1990},
month = {1}
}