Polysilicon photoconductor for integrated circuits
Abstract
A photoconductive element of polycrystalline silicon is provided with intrinsic response time which does not limit overall circuit response. An undoped polycrystalline silicon layer is deposited by LPCVD to a selected thickness on silicon dioxide. The deposited polycrystalline silicon is then annealed at a selected temperature and for a time effective to obtain crystal sizes effective to produce an enhanced current output. The annealed polycrystalline layer is subsequently exposed and damaged by ion implantation to a damage factor effective to obtain a fast photoconductive response.
- Inventors:
-
- Los Alamos, NM
- Eatontown, NJ
- Issue Date:
- Research Org.:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- OSTI Identifier:
- 867492
- Patent Number(s):
- 4948741
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE Y02E - REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- polysilicon; photoconductor; integrated; circuits; photoconductive; element; polycrystalline; silicon; provided; intrinsic; response; time; limit; overall; circuit; undoped; layer; deposited; lpcvd; selected; thickness; dioxide; annealed; temperature; effective; obtain; crystal; sizes; produce; enhanced; current; output; subsequently; exposed; damaged; implantation; damage; factor; fast; silicon layer; integrated circuits; integrated circuit; polycrystalline silicon; response time; crystalline silicon; silicon dioxide; time effective; selected temperature; subsequently exposed; selected thickness; overall circuit; enhanced current; crystal sizes; current output; circuit response; crystalline layer; undoped polycrystalline; photoconductive element; polysilicon photoconductor; limit overall; intrinsic response; /438/
Citation Formats
Hammond, Robert B, and Bowman, Douglas R. Polysilicon photoconductor for integrated circuits. United States: N. p., 1990.
Web.
Hammond, Robert B, & Bowman, Douglas R. Polysilicon photoconductor for integrated circuits. United States.
Hammond, Robert B, and Bowman, Douglas R. Mon .
"Polysilicon photoconductor for integrated circuits". United States. https://www.osti.gov/servlets/purl/867492.
@article{osti_867492,
title = {Polysilicon photoconductor for integrated circuits},
author = {Hammond, Robert B and Bowman, Douglas R},
abstractNote = {A photoconductive element of polycrystalline silicon is provided with intrinsic response time which does not limit overall circuit response. An undoped polycrystalline silicon layer is deposited by LPCVD to a selected thickness on silicon dioxide. The deposited polycrystalline silicon is then annealed at a selected temperature and for a time effective to obtain crystal sizes effective to produce an enhanced current output. The annealed polycrystalline layer is subsequently exposed and damaged by ion implantation to a damage factor effective to obtain a fast photoconductive response.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1990},
month = {1}
}