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Title: Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy

Abstract

A Method and apparatus for differential spectroscopic atomic-imaging is disclosed for spatial resolution and imaging for display not only individual atoms on a sample surface, but also bonding and the specific atomic species in such bond. The apparatus includes a scanning tunneling microscope (STM) that is modified to include photon biasing, preferably a tuneable laser, modulating electronic surface biasing for the sample, and temperature biasing, preferably a vibration-free refrigerated sample mounting stage. Computer control and data processing and visual display components are also included. The method includes modulating the electronic bias voltage with and without selected photon wavelengths and frequency biasing under a stabilizing (usually cold) bias temperature to detect bonding and specific atomic species in the bonds as the STM rasters the sample. This data is processed along with atomic spatial topography data obtained from the STM raster scan to create a real-time visual image of the atoms on the sample surface.

Inventors:
 [1]
  1. Lakewood, CO
Issue Date:
Research Org.:
Midwest Research Institute, Kansas City, MO (United States)
OSTI Identifier:
867462
Patent Number(s):
4942299
Assignee:
Midwest Research Institute (Kansas City, MO)
Patent Classifications (CPCs):
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
G - PHYSICS G01 - MEASURING G01Q - SCANNING-PROBE TECHNIQUES OR APPARATUS
DOE Contract Number:  
AC02-83CH10093
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; differential; spectroscopic; atomic-imaging; scanning; tunneling; microscopy; disclosed; spatial; resolution; imaging; display; individual; atoms; sample; surface; bonding; specific; atomic; species; bond; microscope; stm; modified; photon; biasing; preferably; tuneable; laser; modulating; electronic; temperature; vibration-free; refrigerated; mounting; stage; computer; control; data; processing; visual; components; included; bias; voltage; selected; wavelengths; frequency; stabilizing; cold; detect; bonds; rasters; processed; topography; obtained; raster; scan; create; real-time; image; scanning tunneling; visual display; sample surface; tunneling microscope; atomic species; data processing; data obtained; spatial resolution; bias voltage; computer control; specific atomic; sample mount; mounting stage; spectroscopic atomic-imaging; raster scan; visual image; temperature bias; photon bias; photon biasing; differential spectroscopic; /250/

Citation Formats

Kazmerski, Lawrence L. Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy. United States: N. p., 1990. Web.
Kazmerski, Lawrence L. Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy. United States.
Kazmerski, Lawrence L. Mon . "Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy". United States. https://www.osti.gov/servlets/purl/867462.
@article{osti_867462,
title = {Method and apparatus for differential spectroscopic atomic-imaging using scanning tunneling microscopy},
author = {Kazmerski, Lawrence L},
abstractNote = {A Method and apparatus for differential spectroscopic atomic-imaging is disclosed for spatial resolution and imaging for display not only individual atoms on a sample surface, but also bonding and the specific atomic species in such bond. The apparatus includes a scanning tunneling microscope (STM) that is modified to include photon biasing, preferably a tuneable laser, modulating electronic surface biasing for the sample, and temperature biasing, preferably a vibration-free refrigerated sample mounting stage. Computer control and data processing and visual display components are also included. The method includes modulating the electronic bias voltage with and without selected photon wavelengths and frequency biasing under a stabilizing (usually cold) bias temperature to detect bonding and specific atomic species in the bonds as the STM rasters the sample. This data is processed along with atomic spatial topography data obtained from the STM raster scan to create a real-time visual image of the atoms on the sample surface.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1990},
month = {1}
}

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