Method for improve x-ray diffraction determinations of residual stress in nickel-base alloys
Abstract
A process for improving the technique of measuring residual stress by x-ray diffraction in pieces of nickel-base alloys which comprises covering part of a predetermined area of the surface of a nickel-base alloy with a dispersion, exposing the covered and uncovered portions of the surface of the alloy to x-rays by way of an x-ray diffractometry apparatus, making x-ray diffraction determinations of the exposed surface, and measuring the residual stress in the alloy based on these determinations. The dispersion is opaque to x-rays and serves a dual purpose since it masks off unsatisfactory signals such that only a small portion of the surface is measured, and it supplies an internal standard by providing diffractogram peaks comparable to the peaks of the nickel alloy so that the alloy peaks can be very accurately located regardless of any sources of error external to the sample.
- Inventors:
-
- Pittsburgh, PA
- Issue Date:
- OSTI Identifier:
- 867348
- Patent Number(s):
- 4918711
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10T - TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- method; improve; x-ray; diffraction; determinations; residual; stress; nickel-base; alloys; process; improving; technique; measuring; pieces; comprises; covering; predetermined; surface; alloy; dispersion; exposing; covered; uncovered; portions; x-rays; diffractometry; apparatus; exposed; based; opaque; serves; dual; purpose; masks; unsatisfactory; signals; portion; measured; supplies; internal; standard; providing; diffractogram; peaks; comparable; nickel; accurately; located; regardless; sources; error; external; sample; nickel-base alloys; base alloy; base alloys; measuring residual; x-ray diffraction; exposed surface; residual stress; nickel alloy; uncovered portion; x-ray diffractometry; nickel-base alloy; accurately locate; /378/106/252/428/
Citation Formats
Berman, Robert M, and Cohen, Isadore. Method for improve x-ray diffraction determinations of residual stress in nickel-base alloys. United States: N. p., 1990.
Web.
Berman, Robert M, & Cohen, Isadore. Method for improve x-ray diffraction determinations of residual stress in nickel-base alloys. United States.
Berman, Robert M, and Cohen, Isadore. Mon .
"Method for improve x-ray diffraction determinations of residual stress in nickel-base alloys". United States. https://www.osti.gov/servlets/purl/867348.
@article{osti_867348,
title = {Method for improve x-ray diffraction determinations of residual stress in nickel-base alloys},
author = {Berman, Robert M and Cohen, Isadore},
abstractNote = {A process for improving the technique of measuring residual stress by x-ray diffraction in pieces of nickel-base alloys which comprises covering part of a predetermined area of the surface of a nickel-base alloy with a dispersion, exposing the covered and uncovered portions of the surface of the alloy to x-rays by way of an x-ray diffractometry apparatus, making x-ray diffraction determinations of the exposed surface, and measuring the residual stress in the alloy based on these determinations. The dispersion is opaque to x-rays and serves a dual purpose since it masks off unsatisfactory signals such that only a small portion of the surface is measured, and it supplies an internal standard by providing diffractogram peaks comparable to the peaks of the nickel alloy so that the alloy peaks can be very accurately located regardless of any sources of error external to the sample.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1990},
month = {1}
}