skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Normal incidence X-ray mirror for chemical microanalysis

Abstract

A non-planar, focusing mirror, to be utilized in both electron column instruments and micro-x-ray fluorescence instruments for performing chemical microanalysis on a sample, comprises a concave, generally spherical base substrate and a predetermined number of alternating layers of high atomic number material and low atomic number material contiguously formed on the base substrate. The thickness of each layer is an integral multiple of the wavelength being reflected and may vary non-uniformly according to a predetermined design. The chemical analytical instruments in which the mirror is used also include a predetermined energy source for directing energy onto the sample and a detector for receiving and detecting the x-rays emitted from the sample; the non-planar mirror is located between the sample and detector and collects the x-rays emitted from the sample at a large solid angle and focuses the collected x-rays to the sample. For electron column instruments, the wavelengths of interest lie above 1.5 nm, while for x-ray fluorescence instruments, the range of interest is below 0.2 nm. Also, x-ray fluorescence instruments include an additional non-planar focusing mirror, formed in the same manner as the previously described m The invention described herein was made in the performance of work under contractmore » with the Department of Energy, Contract No. DE-AC04-76DP00789, and the United States Government has rights in the invention pursuant to this contract.« less

Inventors:
 [1];  [2]
  1. (Tijeras, NM)
  2. (Albuquerque, NM)
Issue Date:
Research Org.:
AT & T CORP
OSTI Identifier:
867337
Patent Number(s):
4916721
Assignee:
United States of America as represented by United States (Washington, DC) SNL
DOE Contract Number:  
AC04-76DP00789
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
normal; incidence; x-ray; mirror; chemical; microanalysis; non-planar; focusing; utilized; electron; column; instruments; micro-x-ray; fluorescence; performing; sample; comprises; concave; spherical; base; substrate; predetermined; alternating; layers; atomic; material; contiguously; formed; thickness; layer; integral; multiple; wavelength; reflected; vary; non-uniformly; according; design; analytical; energy; source; directing; detector; receiving; detecting; x-rays; emitted; located; collects; solid; angle; focuses; collected; wavelengths; lie; nm; range; below; additional; manner; previously; described; performance; contract; department; de-ac04-76dp00789; united; government; rights; pursuant; solid angle; analytical instruments; predetermined energy; normal incidence; focusing mirror; alternating layers; energy source; base substrate; x-ray fluorescence; analytical instrument; previously described; rays emitted; chemical microanalysis; x-ray mirror; integral multiple; directing energy; /378/

Citation Formats

Carr, Martin J., and Romig, Jr., Alton D. Normal incidence X-ray mirror for chemical microanalysis. United States: N. p., 1990. Web.
Carr, Martin J., & Romig, Jr., Alton D. Normal incidence X-ray mirror for chemical microanalysis. United States.
Carr, Martin J., and Romig, Jr., Alton D. Mon . "Normal incidence X-ray mirror for chemical microanalysis". United States. https://www.osti.gov/servlets/purl/867337.
@article{osti_867337,
title = {Normal incidence X-ray mirror for chemical microanalysis},
author = {Carr, Martin J. and Romig, Jr., Alton D.},
abstractNote = {A non-planar, focusing mirror, to be utilized in both electron column instruments and micro-x-ray fluorescence instruments for performing chemical microanalysis on a sample, comprises a concave, generally spherical base substrate and a predetermined number of alternating layers of high atomic number material and low atomic number material contiguously formed on the base substrate. The thickness of each layer is an integral multiple of the wavelength being reflected and may vary non-uniformly according to a predetermined design. The chemical analytical instruments in which the mirror is used also include a predetermined energy source for directing energy onto the sample and a detector for receiving and detecting the x-rays emitted from the sample; the non-planar mirror is located between the sample and detector and collects the x-rays emitted from the sample at a large solid angle and focuses the collected x-rays to the sample. For electron column instruments, the wavelengths of interest lie above 1.5 nm, while for x-ray fluorescence instruments, the range of interest is below 0.2 nm. Also, x-ray fluorescence instruments include an additional non-planar focusing mirror, formed in the same manner as the previously described m The invention described herein was made in the performance of work under contract with the Department of Energy, Contract No. DE-AC04-76DP00789, and the United States Government has rights in the invention pursuant to this contract.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1990},
month = {1}
}

Patent:

Save / Share: