Superlattice strain gage

Noel, Bruce W; Smith, Darryl L; Sinha, Dipen N

Title: Superlattice strain gage

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Abstract

A strain gage comprising a strained-layer superlattice crystal exhibiting piezoelectric properties is described. A substrate upon which such a strained-layer superlattice crystal has been deposited is attached to an element to be monitored for strain. A light source is focused on the superlattice crystal and the light reflected from, passed through, or emitted from the crystal is gathered and compared with previously obtained optical property data to determine the strain in the element.

Inventors:

Noel, Bruce W ^[1]; Smith, Darryl L ^[2]; Sinha, Dipen N ^[2]

Espanola, NM
Los Alamos, NM

Issue Date:: 1990-01-01

Research Org.:: Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

OSTI Identifier:: 867314

Patent Number(s):: 4912355

Assignee:: United States of America as represented by United States (Washington, DC)

Patent Classifications (CPCs):: H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES

G - PHYSICS G01 - MEASURING G01L - MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE

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H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
H01L41/187 - Ceramic compositions {, i.e. synthetic inorganic polycrystalline compounds incl. epitaxial, quasi-crystalline materials}

G - PHYSICS G01 - MEASURING G01L - MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
G01L1/16 - using properties of piezo-electric devices

G - PHYSICS G01 - MEASURING G01B - MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS
G01B11/18 - {using photoelastic elements}

G - PHYSICS G01 - MEASURING G01L - MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
G01L1/24 - by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis {using infra-red, visible light, ultra-violet}

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DOE Contract Number:: W-7405-ENG-36

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: superlattice; strain; gage; comprising; strained-layer; crystal; exhibiting; piezoelectric; properties; described; substrate; deposited; attached; element; monitored; light; source; focused; reflected; passed; emitted; gathered; compared; previously; obtained; optical; property; data; determine; strained-layer superlattice; light reflected; light source; strain gage; optical property; superlattice crystal; layer superlattice; lattice strain; /310/73/

Citation Formats


                    Noel, Bruce W, Smith, Darryl L, and Sinha, Dipen N. Superlattice strain gage.  United States: N. p., 1990. 
        Web.

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                    Noel, Bruce W, Smith, Darryl L, & Sinha, Dipen N. Superlattice strain gage.  United States.

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                    Noel, Bruce W, Smith, Darryl L, and Sinha, Dipen N. Mon .  
        "Superlattice strain gage".  United States.  https://www.osti.gov/servlets/purl/867314.

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@article{osti_867314,

  title        = {Superlattice strain gage},

  author       = {Noel, Bruce W and Smith, Darryl L and Sinha, Dipen N},

  abstractNote = {A strain gage comprising a strained-layer superlattice crystal exhibiting piezoelectric properties is described. A substrate upon which such a strained-layer superlattice crystal has been deposited is attached to an element to be monitored for strain. A light source is focused on the superlattice crystal and the light reflected from, passed through, or emitted from the crystal is gathered and compared with previously obtained optical property data to determine the strain in the element.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1990},

  month        = {1}

}

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