Elastomer degradation sensor using a piezoelectric material
Abstract
A method and apparatus for monitoring the degradation of elastomeric materials is provided. Piezoelectric oscillators are placed in contact with the elastomeric material so that a forced harmonic oscillator with damping is formed. The piezoelectric material is connected to an oscillator circuit,. A parameter such as the resonant frequency, amplitude or Q value of the oscillating system is related to the elasticity of the elastomeric material. Degradation of the elastomeric material causes changes in its elasticity which, in turn, causes the resonant frequency, amplitude or Q of the oscillator to change. These changes are monitored with a peak height monitor, frequency counter, Q-meter, spectrum analyzer, or other measurement circuit. Elasticity of elastomers can be monitored in situ, using miniaturized sensors.
- Inventors:
-
- Livermore, CA
- (late of Livermore, CA)
- Issue Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- OSTI Identifier:
- 867290
- Patent Number(s):
- 4906917
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G - PHYSICS G01 - MEASURING G01R - MEASURING ELECTRIC VARIABLES
- DOE Contract Number:
- W-7405-ENG-48
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- elastomer; degradation; sensor; piezoelectric; material; method; apparatus; monitoring; elastomeric; materials; provided; oscillators; placed; contact; forced; harmonic; oscillator; damping; formed; connected; circuit; parameter; resonant; frequency; amplitude; value; oscillating; related; elasticity; causes; changes; change; monitored; peak; height; monitor; counter; q-meter; spectrum; analyzer; measurement; elastomers; situ; miniaturized; sensors; oscillator circuit; measurement circuit; spectrum analyzer; resonant frequency; piezoelectric material; elastomeric material; causes changes; elastomeric materials; /324/310/
Citation Formats
Olness, Dolores U, and Hirschfeld, deceased, Tomas B. Elastomer degradation sensor using a piezoelectric material. United States: N. p., 1990.
Web.
Olness, Dolores U, & Hirschfeld, deceased, Tomas B. Elastomer degradation sensor using a piezoelectric material. United States.
Olness, Dolores U, and Hirschfeld, deceased, Tomas B. Mon .
"Elastomer degradation sensor using a piezoelectric material". United States. https://www.osti.gov/servlets/purl/867290.
@article{osti_867290,
title = {Elastomer degradation sensor using a piezoelectric material},
author = {Olness, Dolores U and Hirschfeld, deceased, Tomas B.},
abstractNote = {A method and apparatus for monitoring the degradation of elastomeric materials is provided. Piezoelectric oscillators are placed in contact with the elastomeric material so that a forced harmonic oscillator with damping is formed. The piezoelectric material is connected to an oscillator circuit,. A parameter such as the resonant frequency, amplitude or Q value of the oscillating system is related to the elasticity of the elastomeric material. Degradation of the elastomeric material causes changes in its elasticity which, in turn, causes the resonant frequency, amplitude or Q of the oscillator to change. These changes are monitored with a peak height monitor, frequency counter, Q-meter, spectrum analyzer, or other measurement circuit. Elasticity of elastomers can be monitored in situ, using miniaturized sensors.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Jan 01 00:00:00 EST 1990},
month = {Mon Jan 01 00:00:00 EST 1990}
}