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Title: Single event mass spectrometry

Abstract

A means and method for single event time of flight mass spectrometry for analysis of specimen materials. The method of the invention includes pulsing an ion source imposing at least one pulsed ion onto the specimen to produce a corresponding emission of at least one electrically charged particle. The emitted particle is then dissociated into a charged ion component and an uncharged neutral component. The ion and neutral components are then detected. The time of flight of the components are recorded and can be used to analyze the predecessor of the components, and therefore the specimen material. When more than one ion particle is emitted from the specimen per single ion impact, the single event time of flight mass spectrometer described here furnis This invention was made with Government support under Contract No. W-7405-ENG82 awarded by the Department of Energy. The Government has certain rights in the invention.

Inventors:
 [1]
  1. (Ames, IA)
Issue Date:
Research Org.:
Ames Laboratory (AMES), Ames, IA; Iowa State University, Ames, IA (US)
OSTI Identifier:
867246
Patent Number(s):
4894536
Application Number:
07/124,023
Assignee:
Iowa State University Research Foundation, Inc. (Ames, IA) AMES
DOE Contract Number:  
W-7405-ENG-82
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
single; event; mass; spectrometry; means; method; time; flight; analysis; specimen; materials; pulsing; source; imposing; pulsed; produce; corresponding; emission; electrically; charged; particle; emitted; dissociated; component; uncharged; neutral; components; detected; recorded; analyze; predecessor; material; impact; spectrometer; described; furnis; government; support; contract; w-7405-eng82; awarded; department; energy; rights; mass spectrometer; charged particle; mass spectrometry; electrically charged; single event; government support; specimen material; neutral component; flight mass; event time; /250/

Citation Formats

Conzemius, Robert J. Single event mass spectrometry. United States: N. p., 1990. Web.
Conzemius, Robert J. Single event mass spectrometry. United States.
Conzemius, Robert J. Tue . "Single event mass spectrometry". United States. https://www.osti.gov/servlets/purl/867246.
@article{osti_867246,
title = {Single event mass spectrometry},
author = {Conzemius, Robert J.},
abstractNote = {A means and method for single event time of flight mass spectrometry for analysis of specimen materials. The method of the invention includes pulsing an ion source imposing at least one pulsed ion onto the specimen to produce a corresponding emission of at least one electrically charged particle. The emitted particle is then dissociated into a charged ion component and an uncharged neutral component. The ion and neutral components are then detected. The time of flight of the components are recorded and can be used to analyze the predecessor of the components, and therefore the specimen material. When more than one ion particle is emitted from the specimen per single ion impact, the single event time of flight mass spectrometer described here furnis This invention was made with Government support under Contract No. W-7405-ENG82 awarded by the Department of Energy. The Government has certain rights in the invention.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1990},
month = {1}
}

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