Single event mass spectrometry
Abstract
A means and method for single event time of flight mass spectrometry for analysis of specimen materials. The method of the invention includes pulsing an ion source imposing at least one pulsed ion onto the specimen to produce a corresponding emission of at least one electrically charged particle. The emitted particle is then dissociated into a charged ion component and an uncharged neutral component. The ion and neutral components are then detected. The time of flight of the components are recorded and can be used to analyze the predecessor of the components, and therefore the specimen material. When more than one ion particle is emitted from the specimen per single ion impact, the single event time of flight mass spectrometer described here furnis This invention was made with Government support under Contract No. W-7405-ENG82 awarded by the Department of Energy. The Government has certain rights in the invention.
- Inventors:
-
- Ames, IA
- Issue Date:
- Research Org.:
- Ames Laboratory (AMES), Ames, IA; Iowa State Univ., Ames, IA (United States)
- OSTI Identifier:
- 867246
- Patent Number(s):
- 4894536
- Application Number:
- 07/124,023
- Assignee:
- Iowa State University Research Foundation, Inc. (Ames, IA)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- W-7405-ENG-82
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- single; event; mass; spectrometry; means; method; time; flight; analysis; specimen; materials; pulsing; source; imposing; pulsed; produce; corresponding; emission; electrically; charged; particle; emitted; dissociated; component; uncharged; neutral; components; detected; recorded; analyze; predecessor; material; impact; spectrometer; described; furnis; government; support; contract; w-7405-eng82; awarded; department; energy; rights; mass spectrometer; charged particle; mass spectrometry; electrically charged; single event; government support; specimen material; neutral component; flight mass; event time; /250/
Citation Formats
Conzemius, Robert J. Single event mass spectrometry. United States: N. p., 1990.
Web.
Conzemius, Robert J. Single event mass spectrometry. United States.
Conzemius, Robert J. Tue .
"Single event mass spectrometry". United States. https://www.osti.gov/servlets/purl/867246.
@article{osti_867246,
title = {Single event mass spectrometry},
author = {Conzemius, Robert J},
abstractNote = {A means and method for single event time of flight mass spectrometry for analysis of specimen materials. The method of the invention includes pulsing an ion source imposing at least one pulsed ion onto the specimen to produce a corresponding emission of at least one electrically charged particle. The emitted particle is then dissociated into a charged ion component and an uncharged neutral component. The ion and neutral components are then detected. The time of flight of the components are recorded and can be used to analyze the predecessor of the components, and therefore the specimen material. When more than one ion particle is emitted from the specimen per single ion impact, the single event time of flight mass spectrometer described here furnis This invention was made with Government support under Contract No. W-7405-ENG82 awarded by the Department of Energy. The Government has certain rights in the invention.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1990},
month = {1}
}