Photo ion spectrometer
Abstract
A charged particle spectrometer for performing ultrasensitive quantitative analysis of selected atomic components removed from a sample. Significant improvements in performing energy and angular refocusing spectroscopy are accomplished by means of a two dimensional structure for generating predetermined electromagnetic field boundary conditions. Both resonance and non-resonance ionization of selected neutral atomic components allow accumulation of increased chemical information. A multiplexed operation between a SIMS mode and a neutral atomic component ionization mode with EARTOF analysis enables comparison of chemical information from secondary ions and neutral atomic components removed from the sample. An electronic system is described for switching high level signals, such as SIMS signals, directly to a transient recorder and through a charge amplifier to the transient recorder for a low level signal pulse counting mode, such as for a neutral atomic component ionization mode.
- Inventors:
-
- Downers Grove, IL
- Westmont, IL
- Naperville, IL
- Issue Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- OSTI Identifier:
- 867227
- Patent Number(s):
- 4889987
- Assignee:
- ARCH Development Corporation (Chicago, IL)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- W-31109-ENG-38
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- photo; spectrometer; charged; particle; performing; ultrasensitive; quantitative; analysis; selected; atomic; components; removed; sample; significant; improvements; energy; angular; refocusing; spectroscopy; accomplished; means; dimensional; structure; generating; predetermined; electromagnetic; field; boundary; conditions; resonance; non-resonance; ionization; neutral; allow; accumulation; increased; chemical; information; multiplexed; operation; sims; mode; component; eartof; enables; comparison; secondary; electronic; described; switching; level; signals; directly; transient; recorder; charge; amplifier; signal; pulse; counting; charge amplifier; resonance ionization; selected atomic; level signal; quantitative analysis; electromagnetic field; magnetic field; charged particle; atomic components; pulse counting; atomic component; chemical information; significant improvement; signal pulse; field boundary; boundary conditions; ionization mode; neutral atom; dimensional structure; generating predetermined; selected atom; /250/
Citation Formats
Gruen, Dieter M, Young, Charles E, and Pellin, Michael J. Photo ion spectrometer. United States: N. p., 1989.
Web.
Gruen, Dieter M, Young, Charles E, & Pellin, Michael J. Photo ion spectrometer. United States.
Gruen, Dieter M, Young, Charles E, and Pellin, Michael J. Sun .
"Photo ion spectrometer". United States. https://www.osti.gov/servlets/purl/867227.
@article{osti_867227,
title = {Photo ion spectrometer},
author = {Gruen, Dieter M and Young, Charles E and Pellin, Michael J},
abstractNote = {A charged particle spectrometer for performing ultrasensitive quantitative analysis of selected atomic components removed from a sample. Significant improvements in performing energy and angular refocusing spectroscopy are accomplished by means of a two dimensional structure for generating predetermined electromagnetic field boundary conditions. Both resonance and non-resonance ionization of selected neutral atomic components allow accumulation of increased chemical information. A multiplexed operation between a SIMS mode and a neutral atomic component ionization mode with EARTOF analysis enables comparison of chemical information from secondary ions and neutral atomic components removed from the sample. An electronic system is described for switching high level signals, such as SIMS signals, directly to a transient recorder and through a charge amplifier to the transient recorder for a low level signal pulse counting mode, such as for a neutral atomic component ionization mode.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 1989},
month = {Sun Jan 01 00:00:00 EST 1989}
}