Characterization of compounds by time-of-flight measurement utilizing random fast ions

Title: Characterization of compounds by time-of-flight measurement utilizing random fast ions

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Abstract

An apparatus for characterizing the mass of sample and daughter particles, comprising a source for providing sample ions; a fragmentation region wherein a fraction of the sample ions may fragment to produce daughter ion particles; an electrostatic field region held at a voltage level sufficient to effect ion-neutral separation and ion-ion separation of fragments from the same sample ion and to separate ions of different kinetic energy; a detector system for measuring the relative arrival times of particles; and processing means operatively connected to the detector system to receive and store the relative arrival times and operable to compare the arrival times with times detected at the detector when the electrostatic field region is held at a different voltage level and to thereafter characterize the particles. Sample and daughter particles are characterized with respect to mass and other characteristics by detecting at a particle detector the relative time of arrival for fragments of a sample ion at two different electrostatic voltage levels. The two sets of particle arrival times are used in conjunction with the known altered voltage levels to mathematically characterize the sample and daughter fragments. In an alternative embodiment the present invention may be used as a detectormore »« less

Inventors:

Conzemius, Robert J ^[1]

Ames, IA

Issue Date:: 1989-01-01

Research Org.:: Ames Lab., Ames, IA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 866908

Patent Number(s):: 4818862

Assignee:: Iowa State University Research Foundation, Inc. (Ames, IA)

Patent Classifications (CPCs):: H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

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H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J49/40 - Time-of-flight spectrometers
H01J49/004 - {Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn}

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DOE Contract Number:: W-7405-ENG-82

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: characterization; compounds; time-of-flight; measurement; utilizing; random; fast; apparatus; characterizing; mass; sample; daughter; particles; comprising; source; providing; fragmentation; region; fraction; fragment; produce; electrostatic; field; held; voltage; level; sufficient; effect; ion-neutral; separation; ion-ion; fragments; separate; kinetic; energy; detector; measuring; relative; arrival; times; processing; means; operatively; connected; receive; store; operable; compare; detected; thereafter; characterize; characterized; respect; characteristics; detecting; particle; time; levels; sets; conjunction; altered; mathematically; alternative; embodiment; conventional; spectrometer; spectrometry; analysis; enhanced; due; resolving; voltage levels; level sufficient; arrival times; mass spectrometer; alternative embodiment; mass spectrometry; kinetic energy; particle detector; operatively connected; electrostatic field; field region; voltage level; processing means; relative arrival; arrival time; conventional mass; means operative; time-of-flight measurement; /250/

Citation Formats


                    Conzemius, Robert J. Characterization of compounds by time-of-flight measurement utilizing random fast ions.  United States: N. p., 1989. 
        Web.

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                    Conzemius, Robert J. Characterization of compounds by time-of-flight measurement utilizing random fast ions.  United States.

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                    Conzemius, Robert J. Sun .  
        "Characterization of compounds by time-of-flight measurement utilizing random fast ions".  United States.  https://www.osti.gov/servlets/purl/866908.

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@article{osti_866908,

  title        = {Characterization of compounds by time-of-flight measurement utilizing random fast ions},

  author       = {Conzemius, Robert J},

  abstractNote = {An apparatus for characterizing the mass of sample and daughter particles, comprising a source for providing sample ions; a fragmentation region wherein a fraction of the sample ions may fragment to produce daughter ion particles; an electrostatic field region held at a voltage level sufficient to effect ion-neutral separation and ion-ion separation of fragments from the same sample ion and to separate ions of different kinetic energy; a detector system for measuring the relative arrival times of particles; and processing means operatively connected to the detector system to receive and store the relative arrival times and operable to compare the arrival times with times detected at the detector when the electrostatic field region is held at a different voltage level and to thereafter characterize the particles. Sample and daughter particles are characterized with respect to mass and other characteristics by detecting at a particle detector the relative time of arrival for fragments of a sample ion at two different electrostatic voltage levels. The two sets of particle arrival times are used in conjunction with the known altered voltage levels to mathematically characterize the sample and daughter fragments. In an alternative embodiment the present invention may be used as a detector for a conventional mass spectrometer. In this embodiment, conventional mass spectrometry analysis is enhanced due to further mass resolving of the detected ions.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1989},

  month        = {1}

}

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