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Title: Aplanatic and quasi-aplanatic diffraction gratings

Abstract

A reflection diffraction grating having a series of transverse minute grooves of progressively varying spacing along a concave surface enables use of such gratings for X-ray or longer wavelength imaging of objects. The variable groove spacing establishes aplanatism or substantially uniform magnification across the optical aperture. The grating may be used, for example, in X-ray microscopes or telescopes of the imaging type and in X-ray microprobes. Increased spatial resolution and field of view may be realized in X-ray imaging.

Inventors:
 [1]
  1. (Berkeley, CA)
Issue Date:
Research Org.:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA
OSTI Identifier:
866817
Patent Number(s):
4798446
Assignee:
United States of America as represented by United States (Washington, DC) LBNL
DOE Contract Number:  
AC03-76SF00098
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
aplanatic; quasi-aplanatic; diffraction; gratings; reflection; grating; series; transverse; minute; grooves; progressively; varying; spacing; concave; surface; enables; x-ray; wavelength; imaging; variable; groove; establishes; aplanatism; substantially; uniform; magnification; optical; aperture; example; microscopes; telescopes; type; microprobes; increased; spatial; resolution; field; view; realized; ray imaging; diffraction grating; substantially uniform; spatial resolution; concave surface; x-ray imaging; x-ray microscope; reflection diffraction; groove spacing; diffraction gratings; /359/

Citation Formats

Hettrick, Michael C. Aplanatic and quasi-aplanatic diffraction gratings. United States: N. p., 1989. Web.
Hettrick, Michael C. Aplanatic and quasi-aplanatic diffraction gratings. United States.
Hettrick, Michael C. Sun . "Aplanatic and quasi-aplanatic diffraction gratings". United States. https://www.osti.gov/servlets/purl/866817.
@article{osti_866817,
title = {Aplanatic and quasi-aplanatic diffraction gratings},
author = {Hettrick, Michael C.},
abstractNote = {A reflection diffraction grating having a series of transverse minute grooves of progressively varying spacing along a concave surface enables use of such gratings for X-ray or longer wavelength imaging of objects. The variable groove spacing establishes aplanatism or substantially uniform magnification across the optical aperture. The grating may be used, for example, in X-ray microscopes or telescopes of the imaging type and in X-ray microprobes. Increased spatial resolution and field of view may be realized in X-ray imaging.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1989},
month = {1}
}

Patent:

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