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Title: Interferometric apparatus and method for detection and characterization of particles using light scattered therefrom

Interferometric apparatus and method for detection and characterization of particles using light scattered therefrom. Differential phase measurements on scattered light from particles are possible using the two-frequency Zeeman effect laser which emits two frequencies of radiation 250 kHz apart. Excellent discrimination and reproducibility for various pure pollen and bacterial samples in suspension have been observed with a single polarization element. Additionally, a 250 kHz beat frequency was recorded from an individual particle traversing the focused output from the laser in a flow cytometer.
Inventors:
 [1]
  1. (Los Alamos, NM)
Issue Date:
OSTI Identifier:
866679
Assignee:
United States of America as represented by United States (Washington, DC) LANL
Patent Number(s):
US 4764013
Contract Number:
W-7405-ENG-36
Research Org:
Los Alamos National Laboratory (LANL), Los Alamos, NM
Country of Publication:
United States
Language:
English
Subject:
interferometric; apparatus; method; detection; characterization; particles; light; scattered; therefrom; differential; phase; measurements; two-frequency; zeeman; effect; laser; emits; frequencies; radiation; 250; khz; apart; excellent; discrimination; reproducibility; various; pure; pollen; bacterial; samples; suspension; observed; single; polarization; element; additionally; beat; frequency; recorded; individual; particle; traversing; focused; output; flow; cytometer; individual particle; light scattered; scattered light; flow cytometer; beat frequency; phase measurement; differential phase; scattered therefrom; interferometric apparatus; /356/