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Title: Analysis with electron microscope of multielement samples using pure element standards

Abstract

A method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons, simultaneously measuring the electron dosage and x-ray intensities for each sample of element to determine a "K.sub.AB " value to be used in the equation ##EQU1## where I is intensity and C is concentration for elements A and B, and exposing the multielement sample to determine the concentrations of the elements in the sample.

Inventors:
 [1]
  1. Western Springs, IL
Issue Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
OSTI Identifier:
866378
Patent Number(s):
4697080
Assignee:
United States of America as represented by United States (Washington, DC)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
W-31109-ENG-38
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
analysis; electron; microscope; multielement; samples; pure; element; standards; method; modified; analytical; determining; concentration; elements; sample; exposing; differing; thicknesses; beam; electrons; simultaneously; measuring; dosage; x-ray; intensities; determine; value; equation; equ1; intensity; concentrations; simultaneously measuring; electron microscope; analytical electron; multielement sample; /250/378/

Citation Formats

King, Wayne E. Analysis with electron microscope of multielement samples using pure element standards. United States: N. p., 1987. Web.
King, Wayne E. Analysis with electron microscope of multielement samples using pure element standards. United States.
King, Wayne E. Thu . "Analysis with electron microscope of multielement samples using pure element standards". United States. https://www.osti.gov/servlets/purl/866378.
@article{osti_866378,
title = {Analysis with electron microscope of multielement samples using pure element standards},
author = {King, Wayne E},
abstractNote = {A method and modified analytical electron microscope for determining the concentration of elements in a multielement sample by exposing samples with differing thicknesses for each element to a beam of electrons, simultaneously measuring the electron dosage and x-ray intensities for each sample of element to determine a "K.sub.AB " value to be used in the equation ##EQU1## where I is intensity and C is concentration for elements A and B, and exposing the multielement sample to determine the concentrations of the elements in the sample.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1987},
month = {1}
}

Patent:

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