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Title: Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus

Abstract

A fixture is provided for supporting and aligning small samples of material on a goniometer for X-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the X-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an X-ray diffraction apparatus previously limited to the analysis of much larger samples.

Inventors:
 [1];  [2]
  1. Knoxville, TN
  2. (Knoxville, TN)
Issue Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
OSTI Identifier:
866132
Patent Number(s):
4641329
Assignee:
United States of America as represented by United States (Washington, DC)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
DOE Contract Number:  
AC05-84OR21400
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
fixture; supporting; aligning; sample; analyzed; x-ray; diffraction; apparatus; provided; samples; material; goniometer; analysis; sample-containing; capillary; accurately; positioned; rotation; beam; selectively; adjusting; position; relative; axes; prevent; wobble; z; axis; employing; subject; relatively; materials; previously; limited; larger; x-ray diffraction; x-ray beam; z axis; accurately positioned; accurately position; /378/

Citation Formats

Green, Lanny A, and Heck, Jr., Joaquim L. Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus. United States: N. p., 1987. Web.
Green, Lanny A, & Heck, Jr., Joaquim L. Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus. United States.
Green, Lanny A, and Heck, Jr., Joaquim L. Thu . "Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus". United States. https://www.osti.gov/servlets/purl/866132.
@article{osti_866132,
title = {Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus},
author = {Green, Lanny A and Heck, Jr., Joaquim L.},
abstractNote = {A fixture is provided for supporting and aligning small samples of material on a goniometer for X-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the X-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an X-ray diffraction apparatus previously limited to the analysis of much larger samples.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1987},
month = {1}
}

Patent:

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