Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus
Abstract
A fixture is provided for supporting and aligning small samples of material on a goniometer for X-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the X-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an X-ray diffraction apparatus previously limited to the analysis of much larger samples.
- Inventors:
-
- Knoxville, TN
- (Knoxville, TN)
- Issue Date:
- Research Org.:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- OSTI Identifier:
- 866132
- Patent Number(s):
- 4641329
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AC05-84OR21400
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- fixture; supporting; aligning; sample; analyzed; x-ray; diffraction; apparatus; provided; samples; material; goniometer; analysis; sample-containing; capillary; accurately; positioned; rotation; beam; selectively; adjusting; position; relative; axes; prevent; wobble; z; axis; employing; subject; relatively; materials; previously; limited; larger; x-ray diffraction; x-ray beam; z axis; accurately positioned; accurately position; /378/
Citation Formats
Green, Lanny A, and Heck, Jr., Joaquim L. Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus. United States: N. p., 1987.
Web.
Green, Lanny A, & Heck, Jr., Joaquim L. Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus. United States.
Green, Lanny A, and Heck, Jr., Joaquim L. Thu .
"Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus". United States. https://www.osti.gov/servlets/purl/866132.
@article{osti_866132,
title = {Fixture for supporting and aligning a sample to be analyzed in an X-ray diffraction apparatus},
author = {Green, Lanny A and Heck, Jr., Joaquim L.},
abstractNote = {A fixture is provided for supporting and aligning small samples of material on a goniometer for X-ray diffraction analysis. A sample-containing capillary is accurately positioned for rotation in the X-ray beam by selectively adjusting the fixture to position the capillary relative to the x and y axes thereof to prevent wobble and position the sample along the z axis or the axis of rotation. By employing the subject fixture relatively small samples of materials can be analyzed in an X-ray diffraction apparatus previously limited to the analysis of much larger samples.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1987},
month = {1}
}
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