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Title: Method and apparatus for increasing the durability and yield of thin film photovoltaic devices

Thin film photovoltaic cells having a pair of semiconductor layers between an opaque and a transparent electrical contact are manufactured in a method which includes the step of scanning one of the semiconductor layers to determine the location of any possible shorting defect. Upon the detection of such defect, the defect is eliminated to increase the durability and yield of the photovoltaic device.
 [1];  [1]
  1. (Newark, DE)
Issue Date:
OSTI Identifier:
University of Delaware (Newark, DE) NREL
Patent Number(s):
US 4640002
Contract Number:
Research Org:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Country of Publication:
United States
method; apparatus; increasing; durability; yield; film; photovoltaic; devices; cells; pair; semiconductor; layers; opaque; transparent; electrical; contact; manufactured; step; scanning; determine; location; shorting; defect; detection; eliminated; increase; device; transparent electrical; photovoltaic devices; photovoltaic cells; electrical contact; photovoltaic device; semiconductor layer; film photovoltaic; photovoltaic cell; semiconductor layers; /438/136/219/324/356/