Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
Abstract
Thin film photovoltaic cells having a pair of semiconductor layers between an opaque and a transparent electrical contact are manufactured in a method which includes the step of scanning one of the semiconductor layers to determine the location of any possible shorting defect. Upon the detection of such defect, the defect is eliminated to increase the durability and yield of the photovoltaic device.
- Inventors:
-
- Newark, DE
- Issue Date:
- Research Org.:
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- OSTI Identifier:
- 866122
- Patent Number(s):
- 4640002
- Assignee:
- University of Delaware (Newark, DE)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
H - ELECTRICITY H02 - GENERATION H02S - GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-RED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- DOE Contract Number:
- EG-77-C-01-4042
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- method; apparatus; increasing; durability; yield; film; photovoltaic; devices; cells; pair; semiconductor; layers; opaque; transparent; electrical; contact; manufactured; step; scanning; determine; location; shorting; defect; detection; eliminated; increase; device; transparent electrical; photovoltaic devices; photovoltaic cells; electrical contact; photovoltaic device; semiconductor layer; film photovoltaic; photovoltaic cell; semiconductor layers; /438/136/219/324/356/
Citation Formats
Phillips, James E, and Lasswell, Patrick G. Method and apparatus for increasing the durability and yield of thin film photovoltaic devices. United States: N. p., 1987.
Web.
Phillips, James E, & Lasswell, Patrick G. Method and apparatus for increasing the durability and yield of thin film photovoltaic devices. United States.
Phillips, James E, and Lasswell, Patrick G. Thu .
"Method and apparatus for increasing the durability and yield of thin film photovoltaic devices". United States. https://www.osti.gov/servlets/purl/866122.
@article{osti_866122,
title = {Method and apparatus for increasing the durability and yield of thin film photovoltaic devices},
author = {Phillips, James E and Lasswell, Patrick G},
abstractNote = {Thin film photovoltaic cells having a pair of semiconductor layers between an opaque and a transparent electrical contact are manufactured in a method which includes the step of scanning one of the semiconductor layers to determine the location of any possible shorting defect. Upon the detection of such defect, the defect is eliminated to increase the durability and yield of the photovoltaic device.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1987},
month = {1}
}
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