Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
Abstract
Thin film photovoltaic cells having a pair of semiconductor layers between an opaque and a transparent electrical contact are manufactured in a method which includes the step of scanning one of the semiconductor layers to determine the location of any possible shorting defect. Upon the detection of such defect, the defect is eliminated to increase the durability and yield of the photovoltaic device.
- Inventors:
-
- Newark, DE
- Issue Date:
- Research Org.:
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- OSTI Identifier:
- 866122
- Patent Number(s):
- 4640002
- Assignee:
- University of Delaware (Newark, DE)
- Patent Classifications (CPCs):
-
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE Y02E - REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- DOE Contract Number:
- EG-77-C-01-4042
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- method; apparatus; increasing; durability; yield; film; photovoltaic; devices; cells; pair; semiconductor; layers; opaque; transparent; electrical; contact; manufactured; step; scanning; determine; location; shorting; defect; detection; eliminated; increase; device; transparent electrical; photovoltaic devices; photovoltaic cells; electrical contact; photovoltaic device; semiconductor layer; film photovoltaic; photovoltaic cell; semiconductor layers; /438/136/219/324/356/
Citation Formats
Phillips, James E, and Lasswell, Patrick G. Method and apparatus for increasing the durability and yield of thin film photovoltaic devices. United States: N. p., 1987.
Web.
Phillips, James E, & Lasswell, Patrick G. Method and apparatus for increasing the durability and yield of thin film photovoltaic devices. United States.
Phillips, James E, and Lasswell, Patrick G. Thu .
"Method and apparatus for increasing the durability and yield of thin film photovoltaic devices". United States. https://www.osti.gov/servlets/purl/866122.
@article{osti_866122,
title = {Method and apparatus for increasing the durability and yield of thin film photovoltaic devices},
author = {Phillips, James E and Lasswell, Patrick G},
abstractNote = {Thin film photovoltaic cells having a pair of semiconductor layers between an opaque and a transparent electrical contact are manufactured in a method which includes the step of scanning one of the semiconductor layers to determine the location of any possible shorting defect. Upon the detection of such defect, the defect is eliminated to increase the durability and yield of the photovoltaic device.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1987},
month = {1}
}