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Title: Method and apparatus for increasing the durability and yield of thin film photovoltaic devices

Abstract

Thin film photovoltaic cells having a pair of semiconductor layers between an opaque and a transparent electrical contact are manufactured in a method which includes the step of scanning one of the semiconductor layers to determine the location of any possible shorting defect. Upon the detection of such defect, the defect is eliminated to increase the durability and yield of the photovoltaic device.

Inventors:
 [1];  [1]
  1. Newark, DE
Issue Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
OSTI Identifier:
866122
Patent Number(s):
4640002
Assignee:
University of Delaware (Newark, DE)
Patent Classifications (CPCs):
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE Y02E - REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
H - ELECTRICITY H02 - GENERATION H02S - GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-RED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
DOE Contract Number:  
EG-77-C-01-4042
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; apparatus; increasing; durability; yield; film; photovoltaic; devices; cells; pair; semiconductor; layers; opaque; transparent; electrical; contact; manufactured; step; scanning; determine; location; shorting; defect; detection; eliminated; increase; device; transparent electrical; photovoltaic devices; photovoltaic cells; electrical contact; photovoltaic device; semiconductor layer; film photovoltaic; photovoltaic cell; semiconductor layers; /438/136/219/324/356/

Citation Formats

Phillips, James E, and Lasswell, Patrick G. Method and apparatus for increasing the durability and yield of thin film photovoltaic devices. United States: N. p., 1987. Web.
Phillips, James E, & Lasswell, Patrick G. Method and apparatus for increasing the durability and yield of thin film photovoltaic devices. United States.
Phillips, James E, and Lasswell, Patrick G. Thu . "Method and apparatus for increasing the durability and yield of thin film photovoltaic devices". United States. https://www.osti.gov/servlets/purl/866122.
@article{osti_866122,
title = {Method and apparatus for increasing the durability and yield of thin film photovoltaic devices},
author = {Phillips, James E and Lasswell, Patrick G},
abstractNote = {Thin film photovoltaic cells having a pair of semiconductor layers between an opaque and a transparent electrical contact are manufactured in a method which includes the step of scanning one of the semiconductor layers to determine the location of any possible shorting defect. Upon the detection of such defect, the defect is eliminated to increase the durability and yield of the photovoltaic device.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1987},
month = {1}
}

Patent:

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