Method and apparatus for increasing the durability and yield of thin film photovoltaic devices

Title: Method and apparatus for increasing the durability and yield of thin film photovoltaic devices

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Abstract

Thin film photovoltaic cells having a pair of semiconductor layers between an opaque and a transparent electrical contact are manufactured in a method which includes the step of scanning one of the semiconductor layers to determine the location of any possible shorting defect. Upon the detection of such defect, the defect is eliminated to increase the durability and yield of the photovoltaic device.

Inventors:

Phillips, James E ^[1]; Lasswell, Patrick G ^[1]

Newark, DE

Issue Date:: 1987-01-01

Research Org.:: National Renewable Energy Lab. (NREL), Golden, CO (United States)

OSTI Identifier:: 866122

Patent Number(s):: 4640002

Assignee:: University of Delaware (Newark, DE)

Patent Classifications (CPCs):: Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE Y02E - REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION

H - ELECTRICITY H02 - GENERATION H02S - GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-RED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES

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Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE Y02E - REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
Y02E10/50 - Photovoltaic [PV] energy

H - ELECTRICITY H02 - GENERATION H02S - GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRA-RED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
H02S50/10 - Testing of PV devices, e.g. of PV modules or single PV cells

Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
Y10S438/94 - Laser ablative material removal
Y10S136/29 - Testing, calibrating, treating, e.g. aging

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01L - SEMICONDUCTOR DEVICES
H01L31/18 - Processes or apparatus peculiar to the manufacture or treatment of these devices or of parts thereof

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DOE Contract Number:: EG-77-C-01-4042

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: method; apparatus; increasing; durability; yield; film; photovoltaic; devices; cells; pair; semiconductor; layers; opaque; transparent; electrical; contact; manufactured; step; scanning; determine; location; shorting; defect; detection; eliminated; increase; device; transparent electrical; photovoltaic devices; photovoltaic cells; electrical contact; photovoltaic device; semiconductor layer; film photovoltaic; photovoltaic cell; semiconductor layers; /438/136/219/324/356/

Citation Formats


                    Phillips, James E, and Lasswell, Patrick G. Method and apparatus for increasing the durability and yield of thin film photovoltaic devices.  United States: N. p., 1987. 
        Web.

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                    Phillips, James E, & Lasswell, Patrick G. Method and apparatus for increasing the durability and yield of thin film photovoltaic devices.  United States.

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                    Phillips, James E, and Lasswell, Patrick G. Thu .  
        "Method and apparatus for increasing the durability and yield of thin film photovoltaic devices".  United States.  https://www.osti.gov/servlets/purl/866122.

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@article{osti_866122,

  title        = {Method and apparatus for increasing the durability and yield of thin film photovoltaic devices},

  author       = {Phillips, James E and Lasswell, Patrick G},

  abstractNote = {Thin film photovoltaic cells having a pair of semiconductor layers between an opaque and a transparent electrical contact are manufactured in a method which includes the step of scanning one of the semiconductor layers to determine the location of any possible shorting defect. Upon the detection of such defect, the defect is eliminated to increase the durability and yield of the photovoltaic device.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1987},

  month        = {1}

}

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