High resolution collimator system for X-ray detector

Eberhard, Jeffrey W; Cain, Dallas E

Title: High resolution collimator system for X-ray detector

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Abstract

High resolution in an X-ray computerized tomography (CT) inspection system is achieved by using a collimator/detector combination to limit the beam width of the X-ray beam incident on a detector element to the desired resolution width. In a detector such as a high pressure Xenon detector array, a narrow tapered collimator is provided above a wide detector element. The collimator slits have any desired width, as small as a few mils at the top, the slit width is easily controlled, and they are fabricated on standard machines. The slit length determines the slice thickness of the CT image.

Inventors:

Eberhard, Jeffrey W ^[1]; Cain, Dallas E ^[2]

Schenectady, NY
Scotia, NY

Issue Date:: 1987-01-01

OSTI Identifier:: 866117

Patent Number(s):: 4638499

Assignee:: General Electric Company (Schenectady, NY)

Patent Classifications (CPCs):: G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR

G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION

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G - PHYSICS G21 - NUCLEAR PHYSICS G21K - TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR
G21K1/025 - {using multiple collimators, e.g. Bucky screens

G - PHYSICS G01 - MEASURING G01T - MEASUREMENT OF NUCLEAR OR X-RADIATION
G01T1/185 - with ionisation chamber arrangements

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DOE Contract Number:: NPD808763AM

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: resolution; collimator; x-ray; detector; computerized; tomography; inspection; achieved; combination; limit; beam; width; incident; element; desired; pressure; xenon; array; narrow; tapered; provided; wide; slits; mils; top; slit; easily; controlled; fabricated; standard; machines; length; determines; slice; thickness; image; x-ray detector; detector array; x-ray beam; detector element; slit width; beam incident; pressure xenon; narrow tapered; easily controlled; ray detector; computerized tomography; detector combination; /378/250/976/

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                    Eberhard, Jeffrey W, and Cain, Dallas E. High resolution collimator system for X-ray detector.  United States: N. p., 1987. 
        Web.

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                    Eberhard, Jeffrey W, & Cain, Dallas E. High resolution collimator system for X-ray detector.  United States.

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                    Eberhard, Jeffrey W, and Cain, Dallas E. Thu .  
        "High resolution collimator system for X-ray detector".  United States.  https://www.osti.gov/servlets/purl/866117.

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@article{osti_866117,

  title        = {High resolution collimator system for X-ray detector},

  author       = {Eberhard, Jeffrey W and Cain, Dallas E},

  abstractNote = {High resolution in an X-ray computerized tomography (CT) inspection system is achieved by using a collimator/detector combination to limit the beam width of the X-ray beam incident on a detector element to the desired resolution width. In a detector such as a high pressure Xenon detector array, a narrow tapered collimator is provided above a wide detector element. The collimator slits have any desired width, as small as a few mils at the top, the slit width is easily controlled, and they are fabricated on standard machines. The slit length determines the slice thickness of the CT image.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1987},

  month        = {1}

}

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