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Title: Process for measuring degradation of sulfur hexafluoride in high voltage systems

This invention is a method of detecting the presence of toxic and corrosive by-products in high voltage systems produced by electrically induced degradation of SF.sub.6 insulating gas in the presence of certain impurities. It is an improvement over previous methods because it is extremely sensitive, detecting by-products present in parts per billion concentrations, and because the device employed is of a simple design and takes advantage of the by-products natural affinity for fluoride ions. The method employs an ion-molecule reaction cell in which negative ions of the by-products are produced by fluorine attachment. These ions are admitted to a negative ion mass spectrometer and identified by their spectra. This spectrometry technique is an improvement over conventional techniques because the negative ion peaks are strong and not obscured by a major ion spectra of the SF.sub.6 component as is the case in positive ion mass spectrometry.
  1. (Knoxville, TN)
Issue Date:
OSTI Identifier:
United States of America as represented by United States (Washington, DC) ORNL
Patent Number(s):
US 4633082
Contract Number:
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN
Country of Publication:
United States
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