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Title: Negative ion source with low temperature transverse divergence optical system

Abstract

A negative ion source is provided which has extremely low transverse divergence as a result of a unique ion focusing system in which the focal line of an ion beam emanating from an elongated, concave converter surface is outside of the ion exit slit of the source and the path of the exiting ions. The beam source operates with a minimum ion temperature which makes possible a sharply focused (extremely low transverse divergence) ribbon like negative ion beam.

Inventors:
 [1];  [1]
  1. Oak Ridge, TN
Issue Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN
OSTI Identifier:
865935
Patent Number(s):
4602161
Assignee:
United States of America as represented by United States (Washington, DC)
DOE Contract Number:  
W-7405-ENG-26
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
negative; source; temperature; transverse; divergence; optical; provided; extremely; result; unique; focusing; focal; line; beam; emanating; elongated; concave; converter; surface; outside; exit; slit; path; exiting; operates; minimum; makes; sharply; focused; ribbon; beam source; transverse divergence; beam emanating; /250/313/315/376/

Citation Formats

Whealton, John H, and Stirling, William L. Negative ion source with low temperature transverse divergence optical system. United States: N. p., 1986. Web.
Whealton, John H, & Stirling, William L. Negative ion source with low temperature transverse divergence optical system. United States.
Whealton, John H, and Stirling, William L. Wed . "Negative ion source with low temperature transverse divergence optical system". United States. https://www.osti.gov/servlets/purl/865935.
@article{osti_865935,
title = {Negative ion source with low temperature transverse divergence optical system},
author = {Whealton, John H and Stirling, William L},
abstractNote = {A negative ion source is provided which has extremely low transverse divergence as a result of a unique ion focusing system in which the focal line of an ion beam emanating from an elongated, concave converter surface is outside of the ion exit slit of the source and the path of the exiting ions. The beam source operates with a minimum ion temperature which makes possible a sharply focused (extremely low transverse divergence) ribbon like negative ion beam.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1986},
month = {1}
}

Patent:

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