Time of flight mass spectrometer

Title: Time of flight mass spectrometer

Full Record
Other Related Research

Abstract

A time-of-flight mass spectrometer is described in which ions are desorbed from a sample by nuclear fission fragments, such that desorption occurs at the surface of the sample impinged upon by the fission fragments. This configuration allows for the sample to be of any thickness, and eliminates the need for complicated sample preparation.

Inventors:

Ulbricht, Jr., William H. ^[1]

(Arvada, CO)

Issue Date:: 1984-01-01

Research Org.:: New Brunswick Laboratory

OSTI Identifier:: 865295

Patent Number(s):: 4490610

Assignee:: United States of America as represented by United States (Washington, DC)

Patent Classifications (CPCs):: H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS

Show more

H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
H01J49/40 - Time-of-flight spectrometers
H01J49/142 - {using a solid target which is not previously vapourised}

Show less

Resource Type:: Patent

Country of Publication:: United States

Language:: English

Subject:: time; flight; mass; spectrometer; time-of-flight; described; desorbed; sample; nuclear; fission; fragments; desorption; occurs; surface; impinged; configuration; allows; thickness; eliminates; complicated; preparation; time-of-flight mass; fission fragments; sample preparation; mass spectrometer; nuclear fission; configuration allows; flight mass; fission fragment; /250/

Citation Formats


                    Ulbricht, Jr., William H. Time of flight mass spectrometer.  United States: N. p., 1984. 
        Web.

Copy to clipboard


                    Ulbricht, Jr., William H. Time of flight mass spectrometer.  United States.

Copy to clipboard


                    Ulbricht, Jr., William H. Sun .  
        "Time of flight mass spectrometer".  United States.  https://www.osti.gov/servlets/purl/865295.

Copy to clipboard


                    
@article{osti_865295,

  title        = {Time of flight mass spectrometer},

  author       = {Ulbricht, Jr., William H.},

  abstractNote = {A time-of-flight mass spectrometer is described in which ions are desorbed from a sample by nuclear fission fragments, such that desorption occurs at the surface of the sample impinged upon by the fission fragments. This configuration allows for the sample to be of any thickness, and eliminates the need for complicated sample preparation.},

  doi          = {},

  journal      = {},
number       = ,

  volume       = ,

  place        = {United States},

  year         = {1984},

  month        = {1}

}

Copy to clipboard

Patent:

View Patent

Save / Share:

Export Metadata

Save to My Library

Similar Records in DOE Patents and OSTI.GOV collections:

Combined distance-of-flight and time-of-flight mass spectrometer

Patent Enke, Christie G; Ray, Steven J; Graham, Alexander W; ...

A combined distance-of-flight mass spectrometry (DOFMS) and time-of-flight mass spectrometry (TOFMS) instrument includes an ion source configured to produce ions having varying mass-to-charge ratios, a first detector configured to determine when each of the ions travels a predetermined distance, a second detector configured to determine how far each of the ions travels in a predetermined time, and a detector extraction region operable to direct portions of the ions either to the first detector or to the second detector.
Full Text Available
Continuous time-of-flight ion mass spectrometer

Patent Funsten, Herbert O.; Feldman, William C.

A continuous time-of-flight mass spectrometer having an evacuated enclosure with means for generating an electric field located in the evacuated enclosure and means for injecting a sample material into the electric field. A source of continuous ionizing radiation injects ionizing radiation into the electric field to ionize atoms or molecules of the sample material, and timing means determine the time elapsed between arrival of a secondary electron out of said ionized atoms or molecules at a first predetermined location and arrival of a sample ion out of said ionized atoms or molecules at a second predetermined location.
Full Text Available
Linear electronic field time-of-flight ion mass spectrometers

Patent Funsten, Herbert O [Los Alamos, NM]

Time-of-flight mass spectrometer comprising a first drift region and a second drift region enclosed within an evacuation chamber; a means of introducing an analyte of interest into the first drift region; a pulsed ionization source which produces molecular ions from said analyte of interest; a first foil positioned between the first drift region and the second drift region, which dissociates said molecular ions into constituent atomic ions and emits secondary electrons; an electrode which produces secondary electrons upon contact with a constituent atomic ion in second drift region; a stop detector comprising a first ion detection region and a secondmore »« less
Full Text Available
Linear electric field time-of-flight ion mass spectrometer

Patent Funsten, Herbert O [Los Alamos, NM]; Feldman, William C [Los Alamos, NM]

A linear electric field ion mass spectrometer having an evacuated enclosure with means for generating a linear electric field located in the evacuated enclosure and means for injecting a sample material into the linear electric field. A source of pulsed ionizing radiation injects ionizing radiation into the linear electric field to ionize atoms or molecules of the sample material, and timing means determine the time elapsed between ionization of atoms or molecules and arrival of an ion out of the ionized atoms or molecules at a predetermined position.
Full Text Available
Time-of-flight direct recoil ion scattering spectrometer

Patent Krauss, Alan R [Naperville, IL]; Gruen, Dieter M [Downers Grove, IL]; Lamich, George J [Orland Park, IL]

A time of flight direct recoil and ion scattering spectrometer beam line (10). The beam line (10) includes an ion source (12) which injects ions into pulse deflection regions (14) and (16) separated by a drift space (18). A final optics stage includes an ion lens and deflection plate assembly (22). The ion pulse length and pulse interval are determined by computerized adjustment of the timing between the voltage pulses applied to the pulsed deflection regions (14) and (16).
Full Text Available

Similar Records