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Title: Ion source for high-precision mass spectrometry

Abstract

The invention is directed to a method for increasing the precision of positive-ion relative abundance measurements conducted in a sector mass spectrometer having an ion source for directing a beam of positive ions onto a collimating slit. The method comprises incorporating in the source an electrostatic lens assembly for providing a positive-ion beam of circular cross section for collimation by the slit.

Inventors:
 [1];  [1];  [1]
  1. Oak Ridge, TN
Issue Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
OSTI Identifier:
865095
Patent Number(s):
4459481
Assignee:
United States of America as represented by United States (Washington, DC)
Patent Classifications (CPCs):
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
DOE Contract Number:  
W-7405-ENG-26
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
source; high-precision; mass; spectrometry; directed; method; increasing; precision; positive-ion; relative; abundance; measurements; conducted; sector; spectrometer; directing; beam; positive; collimating; slit; comprises; incorporating; electrostatic; lens; assembly; providing; circular; section; collimation; lens assembly; method comprises; mass spectrometer; mass spectrometry; method comprise; sector mass; electrostatic lens; /250/

Citation Formats

Todd, Peter J, McKown, Henry S, and Smith, David H. Ion source for high-precision mass spectrometry. United States: N. p., 1984. Web.
Todd, Peter J, McKown, Henry S, & Smith, David H. Ion source for high-precision mass spectrometry. United States.
Todd, Peter J, McKown, Henry S, and Smith, David H. Sun . "Ion source for high-precision mass spectrometry". United States. https://www.osti.gov/servlets/purl/865095.
@article{osti_865095,
title = {Ion source for high-precision mass spectrometry},
author = {Todd, Peter J and McKown, Henry S and Smith, David H},
abstractNote = {The invention is directed to a method for increasing the precision of positive-ion relative abundance measurements conducted in a sector mass spectrometer having an ion source for directing a beam of positive ions onto a collimating slit. The method comprises incorporating in the source an electrostatic lens assembly for providing a positive-ion beam of circular cross section for collimation by the slit.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1984},
month = {1}
}

Patent:

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