Ion source for high-precision mass spectrometry
Abstract
The invention is directed to a method for increasing the precision of positive-ion relative abundance measurements conducted in a sector mass spectrometer having an ion source for directing a beam of positive ions onto a collimating slit. The method comprises incorporating in the source an electrostatic lens assembly for providing a positive-ion beam of circular cross section for collimation by the slit.
- Inventors:
-
- Oak Ridge, TN
- Issue Date:
- Research Org.:
- Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
- OSTI Identifier:
- 865095
- Patent Number(s):
- 4459481
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- W-7405-ENG-26
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- source; high-precision; mass; spectrometry; directed; method; increasing; precision; positive-ion; relative; abundance; measurements; conducted; sector; spectrometer; directing; beam; positive; collimating; slit; comprises; incorporating; electrostatic; lens; assembly; providing; circular; section; collimation; lens assembly; method comprises; mass spectrometer; mass spectrometry; method comprise; sector mass; electrostatic lens; /250/
Citation Formats
Todd, Peter J, McKown, Henry S, and Smith, David H. Ion source for high-precision mass spectrometry. United States: N. p., 1984.
Web.
Todd, Peter J, McKown, Henry S, & Smith, David H. Ion source for high-precision mass spectrometry. United States.
Todd, Peter J, McKown, Henry S, and Smith, David H. Sun .
"Ion source for high-precision mass spectrometry". United States. https://www.osti.gov/servlets/purl/865095.
@article{osti_865095,
title = {Ion source for high-precision mass spectrometry},
author = {Todd, Peter J and McKown, Henry S and Smith, David H},
abstractNote = {The invention is directed to a method for increasing the precision of positive-ion relative abundance measurements conducted in a sector mass spectrometer having an ion source for directing a beam of positive ions onto a collimating slit. The method comprises incorporating in the source an electrostatic lens assembly for providing a positive-ion beam of circular cross section for collimation by the slit.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 1984},
month = {Sun Jan 01 00:00:00 EST 1984}
}
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