Layered ultra-thin coherent structures used as electrical resistors having low temperature coefficient of resistivity
Abstract
A thin film resistor having a controlled temperature coefficient of resistance (TCR) ranging from negative to positive degrees kelvin and having relatively high resistivity. The resistor is a multilayer superlattice crystal containing a plurality of alternating, ultra-thin layers of two different metals. TCR is varied by controlling the thickness of the individual layers. The resistor can be readily prepared by methods compatible with thin film circuitry manufacturing techniques.
- Inventors:
-
- Argonne, IL
- Tucson, AZ
- Woodridge, IL
- Issue Date:
- Research Org.:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- OSTI Identifier:
- 865051
- Patent Number(s):
- 4454495
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01C - RESISTORS
Y - NEW / CROSS SECTIONAL TECHNOLOGIES Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC Y10S - TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- DOE Contract Number:
- W-31109-ENG-38
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- layered; ultra-thin; coherent; structures; electrical; resistors; temperature; coefficient; resistivity; film; resistor; controlled; resistance; tcr; ranging; negative; positive; degrees; kelvin; relatively; multilayer; superlattice; crystal; containing; plurality; alternating; layers; metals; varied; controlling; thickness; individual; readily; prepared; methods; compatible; circuitry; manufacturing; techniques; individual layers; temperature coefficient; controlled temperature; dual layer; readily prepared; manufacturing techniques; superlattice crystal; film resistor; layer superlattice; film circuit; degrees kelvin; crystal containing; /338/505/
Citation Formats
Werner, Thomas R, Falco, Charles M, and Schuller, Ivan K. Layered ultra-thin coherent structures used as electrical resistors having low temperature coefficient of resistivity. United States: N. p., 1984.
Web.
Werner, Thomas R, Falco, Charles M, & Schuller, Ivan K. Layered ultra-thin coherent structures used as electrical resistors having low temperature coefficient of resistivity. United States.
Werner, Thomas R, Falco, Charles M, and Schuller, Ivan K. Sun .
"Layered ultra-thin coherent structures used as electrical resistors having low temperature coefficient of resistivity". United States. https://www.osti.gov/servlets/purl/865051.
@article{osti_865051,
title = {Layered ultra-thin coherent structures used as electrical resistors having low temperature coefficient of resistivity},
author = {Werner, Thomas R and Falco, Charles M and Schuller, Ivan K},
abstractNote = {A thin film resistor having a controlled temperature coefficient of resistance (TCR) ranging from negative to positive degrees kelvin and having relatively high resistivity. The resistor is a multilayer superlattice crystal containing a plurality of alternating, ultra-thin layers of two different metals. TCR is varied by controlling the thickness of the individual layers. The resistor can be readily prepared by methods compatible with thin film circuitry manufacturing techniques.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1984},
month = {1}
}