skip to main content
DOE Patents title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Instrument and method for focusing X-rays, gamma rays and neutrons

Abstract

A crystal diffraction instrument or diffraction grating instrument with an improved crystalline structure or grating spacing structure having a face for receiving a beam of photons or neutrons and diffraction planar spacing or grating spacing along that face with the spacing increasing progressively along the face to provide a decreasing Bragg diffraction angle for a monochromatic radiation and thereby increasing the usable area and acceptance angle. The increased planar spacing for the diffraction crystal is provided by the use of a temperature differential across the crystalline structure, by assembling a plurality of crystalline structures with different compositions, by an individual crystalline structure with a varying composition and thereby a changing planar spacing along its face, and by combinations of these techniques. The increased diffraction grating element spacing is generated during the fabrication of the diffraction grating by controlling the cutting tool that is cutting the grooves or controlling the laser beam, electron beam or ion beam that is exposing the resist layer, etc. It is also possible to vary this variation in grating spacing by applying a thermal gradient to the diffraction grating in much the same manner as is done in the crystal diffraction case.

Inventors:
 [1]
  1. (Hinsdale, IL)
Issue Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL
OSTI Identifier:
864856
Patent Number(s):
4429411
Assignee:
United States of America as represented by United States (Washington, DC) ANL
DOE Contract Number:  
W-31109-ENG-38
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
instrument; method; focusing; x-rays; gamma; rays; neutrons; crystal; diffraction; grating; improved; crystalline; structure; spacing; receiving; beam; photons; planar; increasing; progressively; provide; decreasing; bragg; angle; monochromatic; radiation; usable; acceptance; increased; provided; temperature; differential; assembling; plurality; structures; compositions; individual; varying; composition; changing; combinations; techniques; element; generated; fabrication; controlling; cutting; tool; grooves; laser; electron; exposing; resist; layer; etc; vary; variation; applying; thermal; gradient; manner; crystalline structures; thermal gradient; gamma rays; gamma ray; diffraction grating; laser beam; electron beam; cutting tool; temperature differential; crystalline structure; varying composition; acceptance angle; monochromatic radiation; crystal diffraction; focusing x-rays; diffraction crystal; grating element; element spacing; line structure; /378/250/976/

Citation Formats

Smither, Robert K. Instrument and method for focusing X-rays, gamma rays and neutrons. United States: N. p., 1984. Web.
Smither, Robert K. Instrument and method for focusing X-rays, gamma rays and neutrons. United States.
Smither, Robert K. Sun . "Instrument and method for focusing X-rays, gamma rays and neutrons". United States. https://www.osti.gov/servlets/purl/864856.
@article{osti_864856,
title = {Instrument and method for focusing X-rays, gamma rays and neutrons},
author = {Smither, Robert K.},
abstractNote = {A crystal diffraction instrument or diffraction grating instrument with an improved crystalline structure or grating spacing structure having a face for receiving a beam of photons or neutrons and diffraction planar spacing or grating spacing along that face with the spacing increasing progressively along the face to provide a decreasing Bragg diffraction angle for a monochromatic radiation and thereby increasing the usable area and acceptance angle. The increased planar spacing for the diffraction crystal is provided by the use of a temperature differential across the crystalline structure, by assembling a plurality of crystalline structures with different compositions, by an individual crystalline structure with a varying composition and thereby a changing planar spacing along its face, and by combinations of these techniques. The increased diffraction grating element spacing is generated during the fabrication of the diffraction grating by controlling the cutting tool that is cutting the grooves or controlling the laser beam, electron beam or ion beam that is exposing the resist layer, etc. It is also possible to vary this variation in grating spacing by applying a thermal gradient to the diffraction grating in much the same manner as is done in the crystal diffraction case.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1984},
month = {1}
}

Patent:

Save / Share: