Temperature profile detector
Abstract
Temperature profiles at elevated temperature conditions are monitored by use of an elongated device having two conductors spaced by the minimum distance required to normally maintain an open circuit between them. The melting point of one conductor is selected at the elevated temperature being detected, while the melting point of the other is higher. As the preselected temperature is reached, liquid metal will flow between the conductors, creating short circuits which are detectable as to location.
- Inventors:
-
- West Richland, WA
- Issue Date:
- Research Org.:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
- OSTI Identifier:
- 864579
- Patent Number(s):
- 4388267
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01K - MEASURING TEMPERATURE
G - PHYSICS G21 - NUCLEAR PHYSICS G21C - NUCLEAR REACTORS
- DOE Contract Number:
- EY-76-C-06-1830
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- temperature; profile; detector; profiles; elevated; conditions; monitored; elongated; device; conductors; spaced; minimum; distance; required; normally; maintain; circuit; melting; conductor; selected; detected; preselected; reached; liquid; metal; flow; creating; circuits; detectable; location; profile detector; temperature profiles; temperature conditions; temperature profile; liquid metal; elevated temperature; selected temperature; preselected temperature; conductors spaced; minimum distance; distance required; /376/324/340/374/976/
Citation Formats
Tokarz, Richard D. Temperature profile detector. United States: N. p., 1983.
Web.
Tokarz, Richard D. Temperature profile detector. United States.
Tokarz, Richard D. Sat .
"Temperature profile detector". United States. https://www.osti.gov/servlets/purl/864579.
@article{osti_864579,
title = {Temperature profile detector},
author = {Tokarz, Richard D},
abstractNote = {Temperature profiles at elevated temperature conditions are monitored by use of an elongated device having two conductors spaced by the minimum distance required to normally maintain an open circuit between them. The melting point of one conductor is selected at the elevated temperature being detected, while the melting point of the other is higher. As the preselected temperature is reached, liquid metal will flow between the conductors, creating short circuits which are detectable as to location.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Jan 01 00:00:00 EST 1983},
month = {Sat Jan 01 00:00:00 EST 1983}
}
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