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Title: High temperature measuring device

Abstract

A temperature measuring device for very high design temperatures (to 2,000.degree. C.). The device comprises a homogenous base structure preferably in the form of a sphere or cylinder. The base structure contains a large number of individual walled cells. The base structure has a decreasing coefficient of elasticity within the temperature range being monitored. A predetermined quantity of inert gas is confined within each cell. The cells are dimensionally stable at the normal working temperature of the device. Increases in gaseous pressure within the cells will permanently deform the cell walls at temperatures within the high temperature range to be measured. Such deformation can be correlated to temperature by calibrating similarly constructed devices under known time and temperature conditions.

Inventors:
 [1]
  1. (West Richland, WA)
Issue Date:
Research Org.:
Pacific Northwest National Laboratory (PNNL), Richland, WA
OSTI Identifier:
864566
Patent Number(s):
4386049
Assignee:
United States of America as represented by United States (Washington, DC) PNNL
DOE Contract Number:  
EY-76-C-06-1830
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
temperature; measuring; device; design; temperatures; 000; degree; comprises; homogenous; base; structure; preferably; form; sphere; cylinder; contains; individual; walled; cells; decreasing; coefficient; elasticity; range; monitored; predetermined; quantity; inert; gas; confined; cell; dimensionally; stable; normal; increases; gaseous; pressure; permanently; deform; walls; measured; deformation; correlated; calibrating; similarly; constructed; devices; time; conditions; temperature measuring; temperature conditions; device comprises; temperature range; inert gas; measuring device; dimensionally stable; structure contains; base structure; structure preferably; cell wall; walled cell; /376/116/340/374/

Citation Formats

Tokarz, Richard D. High temperature measuring device. United States: N. p., 1983. Web.
Tokarz, Richard D. High temperature measuring device. United States.
Tokarz, Richard D. Sat . "High temperature measuring device". United States. https://www.osti.gov/servlets/purl/864566.
@article{osti_864566,
title = {High temperature measuring device},
author = {Tokarz, Richard D.},
abstractNote = {A temperature measuring device for very high design temperatures (to 2,000.degree. C.). The device comprises a homogenous base structure preferably in the form of a sphere or cylinder. The base structure contains a large number of individual walled cells. The base structure has a decreasing coefficient of elasticity within the temperature range being monitored. A predetermined quantity of inert gas is confined within each cell. The cells are dimensionally stable at the normal working temperature of the device. Increases in gaseous pressure within the cells will permanently deform the cell walls at temperatures within the high temperature range to be measured. Such deformation can be correlated to temperature by calibrating similarly constructed devices under known time and temperature conditions.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1983},
month = {1}
}

Patent:

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