Method of determining the x-ray limit of an ion gauge
Abstract
An ion gauge having a reduced "x-ray limit" and means for measuring that limit. The gauge comprises an ion gauge of the Bayard-Alpert type having a short collector and having means for varying the grid-collector voltage. The "x-ray limit" (i.e. the collector current resulting from x-rays striking the collector) may then be determined by the formula: ##EQU1## where: I.sub.x ="x-ray limit", I.sub.l and I.sub.h =the collector current at the lower and higher grid voltage respectively; and, .alpha.=the ratio of the collector current due to positive ions at the higher voltage to that at the lower voltage.
- Inventors:
-
- (Bellport, NY)
- Shirley, NY
- Issue Date:
- Research Org.:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- OSTI Identifier:
- 864056
- Patent Number(s):
- 4302679
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01L - MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- DOE Contract Number:
- EY-76-C-02-0016
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- method; determining; x-ray; limit; gauge; reduced; means; measuring; comprises; bayard-alpert; type; collector; varying; grid-collector; voltage; current; resulting; x-rays; striking; determined; formula; equ1; grid; respectively; alpha; ratio; due; positive; x-ray limit; /250/313/
Citation Formats
Edwards, Jr., David, and Lanni, Christopher P. Method of determining the x-ray limit of an ion gauge. United States: N. p., 1981.
Web.
Edwards, Jr., David, & Lanni, Christopher P. Method of determining the x-ray limit of an ion gauge. United States.
Edwards, Jr., David, and Lanni, Christopher P. Thu .
"Method of determining the x-ray limit of an ion gauge". United States. https://www.osti.gov/servlets/purl/864056.
@article{osti_864056,
title = {Method of determining the x-ray limit of an ion gauge},
author = {Edwards, Jr., David and Lanni, Christopher P},
abstractNote = {An ion gauge having a reduced "x-ray limit" and means for measuring that limit. The gauge comprises an ion gauge of the Bayard-Alpert type having a short collector and having means for varying the grid-collector voltage. The "x-ray limit" (i.e. the collector current resulting from x-rays striking the collector) may then be determined by the formula: ##EQU1## where: I.sub.x ="x-ray limit", I.sub.l and I.sub.h =the collector current at the lower and higher grid voltage respectively; and, .alpha.=the ratio of the collector current due to positive ions at the higher voltage to that at the lower voltage.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 1981},
month = {Thu Jan 01 00:00:00 EST 1981}
}
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