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Title: Method of determining the x-ray limit of an ion gauge

Abstract

An ion gauge having a reduced "x-ray limit" and means for measuring that limit. The gauge comprises an ion gauge of the Bayard-Alpert type having a short collector and having means for varying the grid-collector voltage. The "x-ray limit" (i.e. the collector current resulting from x-rays striking the collector) may then be determined by the formula: ##EQU1## where: I.sub.x ="x-ray limit", I.sub.l and I.sub.h =the collector current at the lower and higher grid voltage respectively; and, .alpha.=the ratio of the collector current due to positive ions at the higher voltage to that at the lower voltage.

Inventors:
 [1];  [2]
  1. (Bellport, NY)
  2. (Shirley, NY)
Issue Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY
OSTI Identifier:
864056
Patent Number(s):
4302679
Assignee:
United States of America as represented by United States (Washington, DC) BNL
DOE Contract Number:  
EY-76-C-02-0016
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; determining; x-ray; limit; gauge; reduced; means; measuring; comprises; bayard-alpert; type; collector; varying; grid-collector; voltage; current; resulting; x-rays; striking; determined; formula; equ1; grid; respectively; alpha; ratio; due; positive; x-ray limit; /250/313/

Citation Formats

Edwards, Jr., David, and Lanni, Christopher P. Method of determining the x-ray limit of an ion gauge. United States: N. p., 1981. Web.
Edwards, Jr., David, & Lanni, Christopher P. Method of determining the x-ray limit of an ion gauge. United States.
Edwards, Jr., David, and Lanni, Christopher P. Thu . "Method of determining the x-ray limit of an ion gauge". United States. https://www.osti.gov/servlets/purl/864056.
@article{osti_864056,
title = {Method of determining the x-ray limit of an ion gauge},
author = {Edwards, Jr., David and Lanni, Christopher P.},
abstractNote = {An ion gauge having a reduced "x-ray limit" and means for measuring that limit. The gauge comprises an ion gauge of the Bayard-Alpert type having a short collector and having means for varying the grid-collector voltage. The "x-ray limit" (i.e. the collector current resulting from x-rays striking the collector) may then be determined by the formula: ##EQU1## where: I.sub.x ="x-ray limit", I.sub.l and I.sub.h =the collector current at the lower and higher grid voltage respectively; and, .alpha.=the ratio of the collector current due to positive ions at the higher voltage to that at the lower voltage.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1981},
month = {1}
}

Patent:

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