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Title: Method for detecting trace impurities in gases

Abstract

A technique for considerably improving the sensitivity and specificity of infrared spectrometry as applied to quantitative determination of trace impurities in various carrier or solvent gases is presented. A gas to be examined for impurities is liquefied and infrared absorption spectra of the liquid are obtained. Spectral simplification and number densities of impurities in the optical path are substantially higher than are obtainable in similar gas-phase analyses. Carbon dioxide impurity (.about.2 ppm) present in commercial Xe and ppm levels of Freon 12 and vinyl chloride added to liquefied air are used to illustrate the method.

Inventors:
 [1];  [2];  [3];  [3]
  1. Santa Fe, NM
  2. (Los Alamos, NM)
  3. Los Alamos, NM
Issue Date:
Research Org.:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
OSTI Identifier:
863871
Patent Number(s):
4264814
Assignee:
United States of America as represented by United States (Washington, DC)
Patent Classifications (CPCs):
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
method; detecting; trace; impurities; gases; technique; considerably; improving; sensitivity; specificity; infrared; spectrometry; applied; quantitative; determination; various; carrier; solvent; gas; examined; liquefied; absorption; spectra; liquid; obtained; spectral; simplification; densities; optical; path; substantially; obtainable; similar; gas-phase; analyses; carbon; dioxide; impurity; ppm; commercial; xe; levels; freon; 12; vinyl; chloride; added; air; illustrate; quantitative determination; vinyl chloride; carbon dioxide; optical path; trace impurities; absorption spectra; detecting trace; infrared spectrometry; /250/

Citation Formats

Freund, Samuel M, Maier, II, William B., Holland, Redus F, and Beattie, Willard H. Method for detecting trace impurities in gases. United States: N. p., 1981. Web.
Freund, Samuel M, Maier, II, William B., Holland, Redus F, & Beattie, Willard H. Method for detecting trace impurities in gases. United States.
Freund, Samuel M, Maier, II, William B., Holland, Redus F, and Beattie, Willard H. Thu . "Method for detecting trace impurities in gases". United States. https://www.osti.gov/servlets/purl/863871.
@article{osti_863871,
title = {Method for detecting trace impurities in gases},
author = {Freund, Samuel M and Maier, II, William B. and Holland, Redus F and Beattie, Willard H},
abstractNote = {A technique for considerably improving the sensitivity and specificity of infrared spectrometry as applied to quantitative determination of trace impurities in various carrier or solvent gases is presented. A gas to be examined for impurities is liquefied and infrared absorption spectra of the liquid are obtained. Spectral simplification and number densities of impurities in the optical path are substantially higher than are obtainable in similar gas-phase analyses. Carbon dioxide impurity (.about.2 ppm) present in commercial Xe and ppm levels of Freon 12 and vinyl chloride added to liquefied air are used to illustrate the method.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1981},
month = {1}
}