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Title: Gaseous trace impurity analyzer and method

Abstract

Simple apparatus for analyzing trace impurities in a gas, such as helium or hydrogen, comprises means for drawing a measured volume of the gas as sample into a heated zone. A segregable portion of the zone is then chilled to condense trace impurities in the gas in the chilled portion. The gas sample is evacuated from the heated zone including the chilled portion. Finally, the chilled portion is warmed to vaporize the condensed impurities in the order of their boiling points. As the temperature of the chilled portion rises, pressure will develop in the evacuated, heated zone by the vaporization of an impurity. The temperature at which the pressure increase occurs identifies that impurity and the pressure increase attained until the vaporization of the next impurity causes a further pressure increase is a measure of the quantity of the preceding impurity.

Inventors:
 [1];  [2]
  1. (Bellport, NY)
  2. (Setauket, NY)
Issue Date:
Research Org.:
Brookhaven National Laboratory (BNL), Upton, NY
OSTI Identifier:
863619
Patent Number(s):
4214473
Assignee:
United States of America as represented by United States (Washington, DC) BNL
DOE Contract Number:  
EY-76-C-02-0016
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
gaseous; trace; impurity; analyzer; method; simple; apparatus; analyzing; impurities; gas; helium; hydrogen; comprises; means; drawing; measured; volume; sample; heated; zone; segregable; portion; chilled; condense; evacuated; including; finally; warmed; vaporize; condensed; boiling; temperature; rises; pressure; vaporization; increase; occurs; identifies; attained; causes; measure; quantity; preceding; pressure increase; gas sample; trace impurities; comprises means; heated zone; simple apparatus; trace impurity; /73/374/

Citation Formats

Edwards, Jr., David, and Schneider, William. Gaseous trace impurity analyzer and method. United States: N. p., 1980. Web.
Edwards, Jr., David, & Schneider, William. Gaseous trace impurity analyzer and method. United States.
Edwards, Jr., David, and Schneider, William. Tue . "Gaseous trace impurity analyzer and method". United States. https://www.osti.gov/servlets/purl/863619.
@article{osti_863619,
title = {Gaseous trace impurity analyzer and method},
author = {Edwards, Jr., David and Schneider, William},
abstractNote = {Simple apparatus for analyzing trace impurities in a gas, such as helium or hydrogen, comprises means for drawing a measured volume of the gas as sample into a heated zone. A segregable portion of the zone is then chilled to condense trace impurities in the gas in the chilled portion. The gas sample is evacuated from the heated zone including the chilled portion. Finally, the chilled portion is warmed to vaporize the condensed impurities in the order of their boiling points. As the temperature of the chilled portion rises, pressure will develop in the evacuated, heated zone by the vaporization of an impurity. The temperature at which the pressure increase occurs identifies that impurity and the pressure increase attained until the vaporization of the next impurity causes a further pressure increase is a measure of the quantity of the preceding impurity.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1980},
month = {1}
}

Patent:

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