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Title: Interferometer for the measurement of plasma density

Abstract

An interferometer which combines the advantages of a coupled cavity interferometer requiring alignment of only one light beam, and a quadrature interferometer which has the ability to track multi-fringe phase excursions unambiguously. The device utilizes a Bragg cell for generating a signal which is electronically analyzed to unambiguously determine phase modulation which is proportional to the path integral of the plasma density.

Inventors:
 [1]
  1. (Los Alamos, NM)
Issue Date:
Research Org.:
Los Alamos National Laboratory (LANL), Los Alamos, NM
OSTI Identifier:
863486
Patent Number(s):
4183671
Assignee:
United States of America as represented by United States (Washington, DC) LANL
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
interferometer; measurement; plasma; density; combines; advantages; coupled; cavity; requiring; alignment; light; beam; quadrature; ability; track; multi-fringe; phase; excursions; unambiguously; device; utilizes; bragg; cell; generating; signal; electronically; analyzed; determine; modulation; proportional; path; integral; plasma density; device utilizes; light beam; phase modulation; coupled cavity; bragg cell; /356/376/

Citation Formats

Jacobson, Abram R. Interferometer for the measurement of plasma density. United States: N. p., 1980. Web.
Jacobson, Abram R. Interferometer for the measurement of plasma density. United States.
Jacobson, Abram R. Tue . "Interferometer for the measurement of plasma density". United States. https://www.osti.gov/servlets/purl/863486.
@article{osti_863486,
title = {Interferometer for the measurement of plasma density},
author = {Jacobson, Abram R.},
abstractNote = {An interferometer which combines the advantages of a coupled cavity interferometer requiring alignment of only one light beam, and a quadrature interferometer which has the ability to track multi-fringe phase excursions unambiguously. The device utilizes a Bragg cell for generating a signal which is electronically analyzed to unambiguously determine phase modulation which is proportional to the path integral of the plasma density.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1980},
month = {1}
}

Patent:

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