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Title: Focal-surface detector for heavy ions

Abstract

A detector of the properties of individual charged particles in a beam includes a gridded ionization chamber, a cathode, a plurality of resistive-wire proportional counters, a plurality of anode sections, and means for controlling the composition and pressure of gas in the chamber. Signals generated in response to the passage of charged particles can be processed to identify the energy of the particles, their loss of energy per unit distance in an absorber, and their angle of incidence. In conjunction with a magnetic spectrograph, the signals can be used to identify particles and their state of charge. The detector is especially useful for analyzing beams of heavy ions, defined as ions of atomic mass greater than 10 atomic mass units.

Inventors:
 [1];  [2];  [3]
  1. (Downers Grove, IL)
  2. (La Grange Park, IL)
  3. (Beloit, WI)
Issue Date:
Research Org.:
Argonne National Laboratory (ANL), Argonne, IL
OSTI Identifier:
863327
Patent Number(s):
4150290
Assignee:
United States of America as represented by United States (Washington, DC) ANL
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
focal-surface; detector; heavy; properties; individual; charged; particles; beam; gridded; ionization; chamber; cathode; plurality; resistive-wire; proportional; counters; anode; sections; means; controlling; composition; pressure; gas; signals; generated; response; passage; processed; identify; energy; loss; unit; distance; absorber; angle; incidence; conjunction; magnetic; spectrograph; charge; especially; useful; analyzing; beams; defined; atomic; mass; 10; units; atomic mass; proportional counter; especially useful; charged particles; charged particle; ionization chamber; signals generated; anode section; proportional counters; /250/

Citation Formats

Erskine, John R., Braid, Thomas H., and Stoltzfus, Joseph C. Focal-surface detector for heavy ions. United States: N. p., 1979. Web.
Erskine, John R., Braid, Thomas H., & Stoltzfus, Joseph C. Focal-surface detector for heavy ions. United States.
Erskine, John R., Braid, Thomas H., and Stoltzfus, Joseph C. Mon . "Focal-surface detector for heavy ions". United States. https://www.osti.gov/servlets/purl/863327.
@article{osti_863327,
title = {Focal-surface detector for heavy ions},
author = {Erskine, John R. and Braid, Thomas H. and Stoltzfus, Joseph C.},
abstractNote = {A detector of the properties of individual charged particles in a beam includes a gridded ionization chamber, a cathode, a plurality of resistive-wire proportional counters, a plurality of anode sections, and means for controlling the composition and pressure of gas in the chamber. Signals generated in response to the passage of charged particles can be processed to identify the energy of the particles, their loss of energy per unit distance in an absorber, and their angle of incidence. In conjunction with a magnetic spectrograph, the signals can be used to identify particles and their state of charge. The detector is especially useful for analyzing beams of heavy ions, defined as ions of atomic mass greater than 10 atomic mass units.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1979},
month = {1}
}

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