Phase contrast in high resolution electron microscopy
Abstract
This patent relates to a device for developing a phase contrast signal for a scanning transmission electron microscope. The lens system of the microscope is operated in a condition of defocus so that predictable alternate concentric regions of high and low electron density exist in the cone of illumination. Two phase detectors are placed beneath the object inside the cone of illumination, with the first detector having the form of a zone plate, each of its rings covering alternate regions of either higher or lower electron density. The second detector is so configured that it covers the regions of electron density not covered by the first detector. Each detector measures the number of electrons incident thereon and the signal developed by the first detector is subtracted from the signal developed by the record detector to provide a phase contrast signal. (auth)
- Inventors:
- Issue Date:
- OSTI Identifier:
- 7368407
- Patent Number(s):
- 3908124
- Assignee:
- U.S. Energy Research and Development Administration
- Patent Classifications (CPCs):
-
H - ELECTRICITY H01 - BASIC ELECTRIC ELEMENTS H01J - ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: Filed date 1 Jul 1974; Other Information: PAT-APPL-484,740
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; ELECTRON MICROSCOPES; BEAM OPTICS; ELECTROMAGNETIC LENSES; ELECTRON BEAMS; ELECTRON MICROSCOPY; FOCUSING; IMAGES; BEAMS; LENSES; LEPTON BEAMS; MICROSCOPES; MICROSCOPY; OPTICAL SYSTEMS; PARTICLE BEAMS; 440300* - Miscellaneous Instruments- (-1989)
Citation Formats
Rose, H H. Phase contrast in high resolution electron microscopy. United States: N. p., 1975.
Web.
Rose, H H. Phase contrast in high resolution electron microscopy. United States.
Rose, H H. Tue .
"Phase contrast in high resolution electron microscopy". United States.
@article{osti_7368407,
title = {Phase contrast in high resolution electron microscopy},
author = {Rose, H H},
abstractNote = {This patent relates to a device for developing a phase contrast signal for a scanning transmission electron microscope. The lens system of the microscope is operated in a condition of defocus so that predictable alternate concentric regions of high and low electron density exist in the cone of illumination. Two phase detectors are placed beneath the object inside the cone of illumination, with the first detector having the form of a zone plate, each of its rings covering alternate regions of either higher or lower electron density. The second detector is so configured that it covers the regions of electron density not covered by the first detector. Each detector measures the number of electrons incident thereon and the signal developed by the first detector is subtracted from the signal developed by the record detector to provide a phase contrast signal. (auth)},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Sep 23 00:00:00 EDT 1975},
month = {Tue Sep 23 00:00:00 EDT 1975}
}