Lens system for a photo ion spectrometer
Abstract
A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component is disclosed. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system. 8 figs.
- Inventors:
- Issue Date:
- OSTI Identifier:
- 7266569
- Patent Number(s):
- 4973842
- Application Number:
- PPN: US 7-045587
- Assignee:
- Arch Development Corp., Chicago, IL (United States)
- DOE Contract Number:
- W-31109-ENG-38
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 4 May 1987
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 43 PARTICLE ACCELERATORS; LENSES; DESIGN; SPECTROMETERS; ION BEAMS; PROTECTIVE COATINGS; BEAMS; COATINGS; MEASURING INSTRUMENTS; 430303* - Particle Accelerators- Experimental Facilities & Equipment
Citation Formats
Gruen, D M, Young, C E, and Pellin, M J. Lens system for a photo ion spectrometer. United States: N. p., 1990.
Web.
Gruen, D M, Young, C E, & Pellin, M J. Lens system for a photo ion spectrometer. United States.
Gruen, D M, Young, C E, and Pellin, M J. Tue .
"Lens system for a photo ion spectrometer". United States.
@article{osti_7266569,
title = {Lens system for a photo ion spectrometer},
author = {Gruen, D M and Young, C E and Pellin, M J},
abstractNote = {A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component is disclosed. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system. 8 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1990},
month = {11}
}