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Title: Lens system for a photo ion spectrometer

Abstract

A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component is disclosed. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system. 8 figs.

Inventors:
; ;
Issue Date:
OSTI Identifier:
7266569
Patent Number(s):
4973842 A
Application Number:
PPN: US 7-045587
Assignee:
Arch Development Corp., Chicago, IL (United States) PTO; EDB-94-118131
DOE Contract Number:  
W-31109-ENG-38
Resource Type:
Patent
Resource Relation:
Patent File Date: 4 May 1987
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; LENSES; DESIGN; SPECTROMETERS; ION BEAMS; PROTECTIVE COATINGS; BEAMS; COATINGS; MEASURING INSTRUMENTS; 430303* - Particle Accelerators- Experimental Facilities & Equipment

Citation Formats

Gruen, D.M., Young, C.E., and Pellin, M.J. Lens system for a photo ion spectrometer. United States: N. p., 1990. Web.
Gruen, D.M., Young, C.E., & Pellin, M.J. Lens system for a photo ion spectrometer. United States.
Gruen, D.M., Young, C.E., and Pellin, M.J. Tue . "Lens system for a photo ion spectrometer". United States.
@article{osti_7266569,
title = {Lens system for a photo ion spectrometer},
author = {Gruen, D.M. and Young, C.E. and Pellin, M.J.},
abstractNote = {A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component is disclosed. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system. 8 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1990},
month = {11}
}