Infrared microscope inspection apparatus
Abstract
Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface. 4 figs.
- Inventors:
- Issue Date:
- Research Org.:
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- OSTI Identifier:
- 7261671
- Patent Number(s):
- 4501966
- Application Number:
- PPN: US 6-243415
- Assignee:
- Massachusetts Inst. of Tech., Cambridge, MA (United States)
- DOE Contract Number:
- AC02-76ET20279
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 13 Mar 1981
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; MICROSCOPES; DESIGN; SILICON SOLAR CELLS; INSPECTION; INFRARED RADIATION; OPERATION; DIRECT ENERGY CONVERTERS; ELECTROMAGNETIC RADIATION; EQUIPMENT; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; RADIATIONS; SOLAR CELLS; SOLAR EQUIPMENT; 140501* - Solar Energy Conversion- Photovoltaic Conversion
Citation Formats
Forman, S E, and Caunt, J W. Infrared microscope inspection apparatus. United States: N. p., 1985.
Web.
Forman, S E, & Caunt, J W. Infrared microscope inspection apparatus. United States.
Forman, S E, and Caunt, J W. Tue .
"Infrared microscope inspection apparatus". United States.
@article{osti_7261671,
title = {Infrared microscope inspection apparatus},
author = {Forman, S E and Caunt, J W},
abstractNote = {Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface. 4 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1985},
month = {2}
}
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