Electron beam cutting
Abstract
A method for the cutting of holes 20 Angstroms in diameter, or lines 20 Angstroms wide in a material having positive ionic conduction by the use of a focused electron probe is described. The holes and lines are stable under ambient conditions. 2 figs.
- Inventors:
- Issue Date:
- OSTI Identifier:
- 7249379
- Patent Number(s):
- 4508952
- Application Number:
- PPN: US 6-467559
- Assignee:
- Univ. Patents, Inc., Westport, CT (United States)
- DOE Contract Number:
- AC02-76ER01198
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 17 Feb 1983
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; MATERIALS; ELECTRON BEAM MACHINING; CUTTING; IONIC CONDUCTIVITY; SIZE; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; MACHINING; PHYSICAL PROPERTIES; 360101* - Metals & Alloys- Preparation & Fabrication; 360201 - Ceramics, Cermets, & Refractories- Preparation & Fabrication; 360601 - Other Materials- Preparation & Manufacture
Citation Formats
Mochel, M E, and Humphreys, C J. Electron beam cutting. United States: N. p., 1985.
Web.
Mochel, M E, & Humphreys, C J. Electron beam cutting. United States.
Mochel, M E, and Humphreys, C J. Tue .
"Electron beam cutting". United States.
@article{osti_7249379,
title = {Electron beam cutting},
author = {Mochel, M E and Humphreys, C J},
abstractNote = {A method for the cutting of holes 20 Angstroms in diameter, or lines 20 Angstroms wide in a material having positive ionic conduction by the use of a focused electron probe is described. The holes and lines are stable under ambient conditions. 2 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1985},
month = {4}
}