Precision contour gage
Abstract
An apparatus for gaging the contour of a machined part includes a rotary slide assembly, a kinematic mount to move the apparatus into and out of position for measuring the part while the part is still on the machining apparatus, a linear probe assembly with a suspension arm and a probe assembly including as probe tip for providing a measure of linear displacement of the tip on the surface of the part, a means for changing relative positions between the part and the probe tip, and a means for recording data points representing linear positions of the probe tip at prescribed rotation intervals in the position changes between the part and the probe tip. 5 figs.
- Inventors:
- Issue Date:
- OSTI Identifier:
- 7164573
- Patent Number(s):
- 4976043
- Application Number:
- PPN: US 7-308336
- Assignee:
- Dept. of Energy, Washington, DC (United States)
- DOE Contract Number:
- AC04-76DP03533
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 9 Feb 1989
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; MACHINE PARTS; SHAPE; MEASURING INSTRUMENTS; DESIGN; DISPLACEMENT GAGES; MATERIALS HANDLING EQUIPMENT; RECORDING SYSTEMS; EQUIPMENT; 440800* - Miscellaneous Instrumentation- (1990-)
Citation Formats
Bieg, L F. Precision contour gage. United States: N. p., 1990.
Web.
Bieg, L F. Precision contour gage. United States.
Bieg, L F. Tue .
"Precision contour gage". United States.
@article{osti_7164573,
title = {Precision contour gage},
author = {Bieg, L F},
abstractNote = {An apparatus for gaging the contour of a machined part includes a rotary slide assembly, a kinematic mount to move the apparatus into and out of position for measuring the part while the part is still on the machining apparatus, a linear probe assembly with a suspension arm and a probe assembly including as probe tip for providing a measure of linear displacement of the tip on the surface of the part, a means for changing relative positions between the part and the probe tip, and a means for recording data points representing linear positions of the probe tip at prescribed rotation intervals in the position changes between the part and the probe tip. 5 figs.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Dec 11 00:00:00 EST 1990},
month = {Tue Dec 11 00:00:00 EST 1990}
}
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