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Title: Method and apparatus for increasing the durability and yield of thin film photovoltaic devices

Thin film photovoltaic cells having a pair of semiconductor layers between an opaque and a transparent electrical contact are manufactured in a method which includes the step of scanning one of the semiconductor layers to determine the location of any possible shorting defect. Upon the detection of such defect, the defect is eliminated to increase the durability and yield of the photovoltaic device. 10 figs.
Inventors:
;
Issue Date:
OSTI Identifier:
7157562
Assignee:
Univ. of Delaware, Newark, DE (United States) PTO; EDB-94-122107
Patent Number(s):
US 4640002; A
Application Number:
PPN: US 6-805435
Contract Number:
EG-77-C-01-4042
Resource Relation:
Patent File Date: 5 Dec 1985
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; PHOTOVOLTAIC CELLS; FABRICATION; DEFECTS; DETECTION; MONITORING; RELIABILITY; REMOVAL; SEMICONDUCTOR MATERIALS; DIRECT ENERGY CONVERTERS; MATERIALS; PHOTOELECTRIC CELLS; 140501* - Solar Energy Conversion- Photovoltaic Conversion